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首页> 外文期刊>Journal of Applied Physics >Chirally oriented heteroepitaxial thin films grown by pulsed laser deposition: Pt(621) on SrTiO3(621)
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Chirally oriented heteroepitaxial thin films grown by pulsed laser deposition: Pt(621) on SrTiO3(621)

机译:通过脉冲激光沉积生长的手性异质外延薄膜:SrTiO3(621)上的Pt(621)

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Pulsed laser deposition has been used to grow Pt(621) thin films having a chiral orientation on SrTiO3(621) substrates. Films were deposited over a range of conditions, then characterized for their crystallinity and epitaxy using x-ray diffraction and for their surface morphologies using atomic force microscopy (AFM). Films deposited at 600 degreesC grew epitaxially, but with an island growth mode. Pt deposited at 250 degreesC displayed smooth surfaces but did not grow epitaxially. A three-step process wherein films were seeded at 600 degreesC, deposited at 250 degreesC, and postannealed was shown to result in excellent epitaxial growth and flat surface morphologies. Films grown using the three-step process exhibited excellent epitaxy, having the orientation relationship (621)(Pt)parallel to(621)(SrTiO3):[0 (1) over bar2](Pt)parallel to[0 (1) over bar2](SrTiO3). When postannealed at 800 degreesC, they exhibited flat surfaces (rmsapproximate to20 Angstrom) having long terraces separated by steps running along the expected [0 (1) over bar2] direction of the SrTiO3(621) substrate. Films postannealed at 600 degreesC were flatter (rmsapproximate to10 A) with no evident step directionality. The SrTiO3(621) substrates were observed to be extremely flat (rmsapproximate to2 Angstrom) and to have morphologically featureless surfaces, as expected for a (621) surface. The good crystalline quality of the SrTiO3 substrate surface is considered to drive the growth of the chirally oriented heteroepitaxial Pt films. Similarities and differences between Pt growth on chiral surfaces and on low-index achiral surfaces are discussed. (C) 2004 American Institute of Physics.
机译:脉冲激光沉积已用于在SrTiO3(621)衬底上生长具有手性取向的Pt(621)薄膜。在一定条件下沉积薄膜,然后使用X射线衍射表征其结晶度和外延,并使用原子力显微镜(AFM)表征其表面形态。在600℃下沉积的膜外延生长,但是具有岛生长模式。在250℃下沉积的Pt显示出光滑的表面,但是没有外延生长。显示了三步工艺,其中膜在600摄氏度下播种,在250摄氏度下沉积并进行后退火,可导致出色的外延生长和平坦的表面形貌。使用三步法生长的薄膜表现出优异的外延性,其取向关系(621)(Pt)平行于(621)(SrTiO3):[0(1)over bar2](Pt)平行于[0(1)over bar2](SrTiO3)。当在800摄氏度下进行后退火时,它们呈现出平坦的表面(均方根近似为20埃),具有长阶梯,阶梯沿着SrTiO3(621)基材的预期[bar(bar2)方向[0(1)]延伸。在600摄氏度后退火的薄膜较平坦(均方根约为10 A),没有明显的阶跃方向性。观察到SrTiO3(621)基底非常平坦(均方根约为2埃),并且具有形态学上无特征的表面,这是对(621)表面的预期。 SrTiO3基体表面的良好结晶质量被认为可以驱动手性取向的异质外延Pt膜的生长。讨论了手性表面和低折射率非手性表面上Pt生长之间的异同。 (C)2004美国物理研究所。

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