首页> 外文期刊>Journal of Applied Physics >Production efficiencies of Kr~*(1s_5,1s_4) atoms leading to vacuum-ultraviolet emissions in ac plasma display panels with Kr-Ne binary mixtures measured by laser-absorption spectroscopy
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Production efficiencies of Kr~*(1s_5,1s_4) atoms leading to vacuum-ultraviolet emissions in ac plasma display panels with Kr-Ne binary mixtures measured by laser-absorption spectroscopy

机译:Kr〜*(1s_5,1s_4)原子的生产效率,可通过激光吸收光谱法测量带有Kr-Ne二元混合物的交流等离子显示面板中的真空紫外发射

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摘要

Ne-Kr gas mixtures with high Kr concentrations were applied to ac plasma display panels. Spatiotemporal behaviors of excited Kr atoms in the 1s_5 metastable state and the 1s_4 resonance state were measured by microscopic laser-absorption spectroscopy in the binary mixtures with Kr concentrations of 20% and 40%. A systematic comparison was done between the characteristics of Ne-Kr-filled panels and those of conventional Ne-Xe panels with the same structure but with lower Xe concentrations of 5% and 10%. For example, the total number of Kr~*(1s_5) atoms in a unit cell ranged from 7.4 X 10~7 to 2.0 X 10~8, at the peak was apparently smaller than the value of Xe~*(1s_5) atoms. However, when the difference in the decay rate of the excited atoms by three-body collision processes is taken into account, the production efficiency of vacuum-ultraviolet (VUV) emission from Kr_2~* excimers is as large as that from Xe_2~* excimers in a usual panel since these processes lead directly to the formation of excimers. From the measured density of Kr~*(1s_4) atoms, it is estimated that the contribution of the atomic resonance line is smaller than the excimer band at those high Kr concentrations. In any case, by summing up those two contributions to the VUV emission, the overall efficiency in the Ne-Kr(40%) panel is estimated to be comparable to that in the Ne-Xe(10%) one.
机译:将具有高Kr浓度的Ne-Kr气体混合物应用于交流等离子显示面板。通过显微激光吸收光谱法在Ks浓度为20%和40%的二元混合物中测量了处于1s_5亚稳态和1s_4共振状态的激发Kr原子的时空行为。系统地比较了Ne-Kr填充板的特性与具有相同结构但Xe浓度较低(5%和10%)的传统Ne-Xe板的特性。例如,一个晶胞中Kr〜*(1s_5)原子的总数在7.4 X 10〜7到2.0 X 10〜8的峰值处明显小于Xe〜*(1s_5)原子的值。但是,考虑到三体碰撞过程中激发原子的衰变速率的差异,Kr_2〜*受激准分子的真空紫外(VUV)发射的产生效率与Xe_2〜*受激准分子的产生效率一样大。在通常情况下,由于这些过程直接导致了准分子的形成。从所测量的Kr〜*(1s_4)原子的密度,估计在那些高Kr浓度下,原子共振线的贡献小于受激准分子带。在任何情况下,通过将这两个对VUV排放的贡献相加,估计Ne-Kr(40%)面板的总体效率与Ne-Xe(10%)面板的总体效率相当。

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