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首页> 外文期刊>Journal of Applied Physics >Fabrication of cerium-doped LaNiO_3 thin films on LaAlO_3 (100) substrate by pulsed laser deposition
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Fabrication of cerium-doped LaNiO_3 thin films on LaAlO_3 (100) substrate by pulsed laser deposition

机译:通过脉冲激光沉积在LaAlO_3(100)衬底上制备铈掺杂LaNiO_3薄膜

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摘要

In this study we report the fabrication of La_(1-x)Ce_xNiO_3 (0 ≤ x ≤ 0.4) thin films on a LaAlO_3 (100) substrate by pulsed laser deposition where the cerium ions are believed to be in the Ce (Ⅳ) oxidation state. At low Ce concentrations, the films grow in the (100) direction with a pseudocubic structure and above x~0.3, they exhibit a change in the crystal symmetry. Core-level photoelectron spectroscopic studies of the thin films deposited have shown that the cerium exists in the +4 oxidation state. Correspondingly, the nickel exhibits mixed valency in these thin films. Conductivity of this highly metallic system progressively decreases as more and more Ce is doped. In the range 0.3 < x < 0.4, the system undergoes a transition from metallic to semiconducting behavior. The electrical nature of La_(1-x)Ce_xNiO_3 thin films gives clear indications of significant electron-lattice interactions present for compositions close to the transition.
机译:在这项研究中,我们报告了通过脉冲激光沉积在LaAlO_3(100)衬底上制造La_(1-x)Ce_xNiO_3(0≤x≤0.4)薄膜的过程,其中铈离子被认为是Ce(Ⅳ)氧化州。在低Ce浓度下,薄膜在(100)方向上具有伪立方结构生长,并且在x〜0.3以上时,它们的晶体对称性发生变化。沉积薄膜的核心级光电子能谱研究表明,铈以+4氧化态存在。相应地,镍在这些薄膜中表现出混合价。随着越来越多的Ce掺杂,这种高金属系统的电导率逐渐降低。在0.3

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