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首页> 外文期刊>Journal of Applied Physics >Sub-meV photoluminescence linewidth and > 10~6 cm~2/Vs electron mobility in AlGaAs/GaAs quantum wells grown by metalorganic vapor phase epitaxy on slightly misoriented substrates
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Sub-meV photoluminescence linewidth and > 10~6 cm~2/Vs electron mobility in AlGaAs/GaAs quantum wells grown by metalorganic vapor phase epitaxy on slightly misoriented substrates

机译:金属有机气相外延在取向不佳的衬底上生长的AlGaAs / GaAs量子阱中的亚meV光致发光线宽和> 10〜6 cm〜2 / Vs电子迁移率

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摘要

We report sub-meV (as low as 0.6 meV) low-temperature photoluminescence linewidth and high low-temperature electron mobility (μ~ 1-1.5 X 10~6 cm~2/Vs) of GaAs quantum wells in AlGaAs barriers grown by standard metalorganic vapor phase epitaxy. These records values are achieved by epitaxial growth on (100) slightly misoriented substrates [ ≤ 0.6 degrees off-(100) GaAs substrates] in combination with a high Ⅴ/Ⅲ ratio for AlGaAs growth. Such small misorientations are sufficient to drastically modify the optical and transport properties as well as the growth mode and surface morphologies of both GaAs and AlGaAs epitaxial layers, allowing greater interface quality and reduced impurity incorporation. The quantum wells so obtained show optical properties comparable to high-quality samples grown by molecular beam epitaxy. In addition, the slight misorientation considerably reduces the impact of substrate temperature on electron mobility, which allows achieving high values of μ within a much broader range of growth temperatures.
机译:我们报告了标准生长的AlGaAs势垒中GaAs量子阱的亚meV(低至0.6 meV)低温光致发光线宽和高低温电子迁移率(μ〜1-1.5 X 10〜6 cm〜2 / Vs)金属有机气相外延。这些记录值是通过在(100)轻微取向不正确的衬底上(与(100)GaAs衬底相距≤0.6度)上外延生长以及AlGaAs生长的高Ⅴ/Ⅲ比来实现的。这种小的取向错误足以彻底改变GaAs和AlGaAs外延层的光学和传输特性以及生长模式和表面形态,从而实现更高的界面质量并减少杂质掺入。如此获得的量子阱显示出与通过分子束外延生长的高质量样品相当的光学性质。另外,轻微的取向错误大大降低了衬底温度对电子迁移率的影响,这允许在更宽的生长温度范围内获得高的μ值。

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