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Uniformity assessment of key characteristics of quantum-dot infrared detectors: A prerequisite for focal plane arrays

机译:量子点红外探测器关键特性的均匀性评估:焦平面阵列的前提条件

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摘要

We have studied some key characteristics of individual InAs/GaAs quantum-dot infrared photodetectors in a linear array to assess their suitability for imaging applications. The dark current-voltage characteristics of the devices in the array are almost identical. Furthermore, the low-temperature (78 K) photoresponse spectra are nearly identical for all devices. The average peak responsivity was about 1.03 A/W, while the average peak detectivity was about 2.16 X 10~9 cm Hz~(1/2)/W. The standard deviations of these two metrics and those of other important parameters were relatively small. Uniformity of individual device characteristics over large arrays is an important prerequisite for high-quality imaging arrays.
机译:我们已经研究了线性阵列中单个InAs / GaAs量子点红外光电探测器的一些关键特性,以评估其在成像应用中的适用性。阵列中器件的暗电流-电压特性几乎相同。此外,所有设备的低温(78 K)光响应光谱几乎相同。平均峰值响应度约为1.03 A / W,而平均峰值检测度约为2.16 X 10〜9 cm Hz〜(1/2)/ W。这两个指标的标准偏差以及其他重要参数的标准偏差相对较小。大型阵列上单个设备特性的均匀性是高质量成像阵列的重要前提。

著录项

  • 来源
    《Journal of Applied Physics》 |2006年第8期|p.084322.1-084322.5|共5页
  • 作者

    D. Pal; E. Towe;

  • 作者单位

    Laboratory for Photonics, Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;计量学;
  • 关键词

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