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首页> 外文期刊>Journal of Applied Physics >A method for applying a large persistent in-plane biaxial stress to influence the perpendicular magnetic anisotropy of magnetic thin films
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A method for applying a large persistent in-plane biaxial stress to influence the perpendicular magnetic anisotropy of magnetic thin films

机译:一种施加大的持续平面内双轴应力以影响磁性薄膜的垂直磁各向异性的方法

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摘要

We describe a method of applying large persistent biaxial in-plane tensile stress to thin films by loading a Ta substrate with hydrogen. Using this technique, we studied the influence of biaxial stress on the effective perpendicular magnetic anisotropy (K_(eff)) of Ni and Co_(50)Fe_(50) thin films. The K_(eff) of Ni increases by 40% whereas for Co_(50)Fe_(50) it decreases by 15% with respect to that of zero stress state upon applying biaxial stresses of 1.24 and 1.79 GPa, respectively. The results are analyzed using a simple model including shape and magnetoelastic anisotropy contributions. The influence of the saturation magnetization and the mechanical properties of the thin films on the maximum achievable relative change of K_(eff) is discussed.
机译:我们描述了一种通过向Ta衬底加载氢来向薄膜施加大的持续双轴面内拉伸应力的方法。使用这种技术,我们研究了双轴应力对Ni和Co_(50)Fe_(50)薄膜的有效垂直磁各向异性(K_(eff))的影响。 Ni的K_(eff)增加40%,而Co_(50)Fe_(50)分别在施加1.24 GPa和1.79 GPa的双轴应力时相对于零应力状态降低15%。使用包括形状和磁弹性各向异性贡献的简单模型来分析结果。讨论了饱和磁化强度和薄膜的机械性能对可达到的最大K_(eff)相对变化的影响。

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