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首页> 外文期刊>Journal of Applied Physics >A three-dimensional model of single-electron tunneling between a conductive probe and a localized electronic state in a dielectric
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A three-dimensional model of single-electron tunneling between a conductive probe and a localized electronic state in a dielectric

机译:导电探针与电介质中局部电子态之间单电子隧穿的三维模型

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Motivated by recent measurements of force detected single-electron tunneling, we present a three-dimensional model for the tunneling rate between a metallic tip and a localized electronic state in a dielectric surface. The tip is assumed to be semi-infinite, with electron wave functions approximated by plane waves. A localized electron state in the dielectric sample is approximated by a spherical quantum well. The tunneling rate is obtained with the help of Bardeen's approach and is compared with the results for a one-dimensional square barrier model. A comparison with experimental data is also presented.
机译:根据最近测得的力检测到的单电子隧穿的影响,我们提出了介电表面中金属尖端与局部电子态之间的隧穿速率的三维模型。假定尖端为半无限,其电子波函数近似为平面波。电介质样品中的局部电子状态由球形量子阱近似。借助Bardeen方法获得了隧穿速率,并将其与一维方形势垒模型的结果进行了比较。还提供了与实验数据的比较。

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