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首页> 外文期刊>Journal of Applied Physics >Evidence of nonclassical plasma transport in hollow cathodes for electric propulsion
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Evidence of nonclassical plasma transport in hollow cathodes for electric propulsion

机译:空心阴极中用于电推进的非经典等离子体传输的证据

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摘要

Measurements, simplified analyses, and two-dimensional numerical simulations with a fluid plasma model show that classical resistivity cannot account for the elevated electron temperatures and steep plasma potential gradients measured in a 25-27.5 A electric propulsion hollow cathode. The cathode consisted of a 1.5 cm hollow tube with an ~0.28 cm diameter orifice and was operated with 5.5 SCCM (SCCM denotes cubic centimeter per minute at STP) of xenon flow using two different anode geometries: a segmented cone and a circular flat plate. The numerical simulations show that classical resistivity yields as much as four times colder electron temperatures compared to the measured values in the orifice and near-plume regions of the cathode. Classical transport and Ohm's law also predict exceedingly high electron-ion relative drift speeds compared to the electron thermal speed ( > 4). It is found that the addition of anomalous resistivity based on existing growth rate formulas for electron-ion streaming instabilities improves qualitatively the comparison between the numerical results and the time-averaged measurements. Simplified analyses that have been based largely on the axial measurements support the conclusion that additional resistivity is required in Ohm's law to explain the measurements. The combined results from the two-dimensional simulations and the analyses bound the range of enhanced resistivity to be 3-100 times the classical value.
机译:使用流体等离子体模型进行的测量,简化的分析和二维数值模拟表明,经典电阻率无法解释在25-27.5 A电推进空心阴极中测得的升高的电子温度和陡峭的等离子体电势梯度。阴极由直径为1.5cm的空心管组成,管口直径为〜0.28 cm,并使用两种不同的阳极几何形状(分段圆锥和圆形平板)以5.5 SCCM(SCCM表示在STP时为立方厘米/分钟)的氙流运行。数值模拟表明,经典电阻率产生的电子温度是阴极孔口和近雾状区域的测量值的四倍之多。古典传输和欧姆定律还预测,与电子热速度(> 4)相比,电子-离子相对漂移速度极高。已经发现,基于现有的电子离子流不稳定性的生长速率公式,添加反常电阻率可以从质量上改善数值结果与时间平均测量值之间的比较。很大程度上基于轴向测量的简化分析支持以下结论:欧姆定律需要额外的电阻率来解释测量结果。二维模拟和分析的综合结果将提高的电阻率范围限定为经典值的3-100倍。

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