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首页> 外文期刊>Journal of Applied Physics >Actual temperatures of growing surfaces of Ill-nitride-based materials depending on substrates and forced convection conditions in metal organic chemical vapor deposition
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Actual temperatures of growing surfaces of Ill-nitride-based materials depending on substrates and forced convection conditions in metal organic chemical vapor deposition

机译:氮化铝基材料生长表面的实际温度取决于基材和金属有机化学气相沉积中的强制对流条件

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摘要

We have investigated the differences in the actual surface temperature of various substrates for the growth of Ill-nitride materials and the influence of this difference in the characteristics of the resulting epitaxial films. From calculations using the finite element method, high-thermal conductivity substrates have significantly higher surface temperature than substrates with low thermal conductivity in typical growth conditions of metal organic chemical vapor deposition. Also, the hydrodynamics of various growth parameters and the chamber condition play a significant role in establishing the actual surface temperature. The thickness of the substrate is found to be another important factor on the temperature of the surface. High resolution x-ray diffraction analysis of AlGaN epitaxial layers grown on bulk A1N substrates and sapphire substrates with different thicknesses supports our theoretical calculations, showing that the Al compositional discrepancy originated from the differences in the surface temperature during growth.
机译:我们已经研究了用于生长III族氮化物材料的各种衬底的实际表面温度的差异,以及这种差异对所得外延膜特性的影响。通过使用有限元方法进行的计算,在金属有机化学气相沉积的典型生长条件下,高导热率基材的表面温度明显高于低导热率基材。同样,各种生长参数的流体力学和腔室条件在确定实际表面温度方面也起着重要作用。发现基材的厚度是影响表面温度的另一个重要因素。在具有不同厚度的块状AlN衬底和蓝宝石衬底上生长的AlGaN外延层的高分辨率X射线衍射分析支持了我们的理论计算,表明Al组成差异源自生长过程中表面温度的差异。

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  • 来源
    《Journal of Applied Physics 》 |2009年第7期| 073512.1-073512.6| 共6页
  • 作者单位

    Center for Compound Semiconductors and School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Dr. NW, Atlanta, Georgia 30332-0250, USA;

    Center for Compound Semiconductors and School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Dr. NW, Atlanta, Georgia 30332-0250, USA;

    Center for Compound Semiconductors and School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Dr. NW, Atlanta, Georgia 30332-0250, USA;

    Center for Compound Semiconductors and School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Dr. NW, Atlanta, Georgia 30332-0250, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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