Ferrimagnetism in strained Fe_2As thin films on Si(001)

摘要

We present the structural and magnetic properties of Fe_2As thin films grown on Si(100) by molecular beam epitaxy. From the reflection high-energy electron diffraction and x-ray diffraction patterns, the orientation of Fe_2As film on Si(100) was found to be a c-axis in the tetragonal crystal structure. The tetragonal Fe_2As thin film exhibited ferrimagnetic (FIM) ordering at room temperature. The magnetic moment of Fe_2As was 0.1 μ_B/unit cell determined from the saturated magnetic moment. The observed FIM in Fe_2As films was attributed to the strain in the film.