Interlayer exchange coupling in Co_2FeAI_(0.5)Si_(0.5)/Cr/Co_2FeAl_(0.5)Si_(0.5) trilayers

摘要

Interlayer exchange couplings were examined for Co_2FeAl_(0.5)Si_(0.5)(CFAS)/Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO_2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90° coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.