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首页> 外文期刊>Journal of Applied Physics >The effect of surface conductance on lateral gated quantum devices in Si/SiGe heterostructures
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The effect of surface conductance on lateral gated quantum devices in Si/SiGe heterostructures

机译:表面电导对Si / SiGe异质结构中横向门控量子器件的影响

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摘要

Quantum dots in Si/SiGe heterostructures are expected to have relatively long electron spin decoherence times,because of the low density of nuclear spins and the weak coupling between nuclear and electron spins.We provide experimental evidence suggesting that electron motion in a conductive layer parallel to the two-dimensional electron gas,possibly resulting from the donors used to dope the Si quantum well,is responsible for the well-known difficulty in achieving well-controlled dots in this system.Charge motion in the conductive layer can cause depletion on large length scales,making electron confinement in the dot impossible,and can give rise to noise that can overwhelm the single-electron charging signal.Results of capacitance versus gate bias measurements to characterize this conductive layer are presented.
机译:由于核自旋的密度低以及核与电子自旋之间的弱耦合,预计Si / SiGe异质结构中的量子点具有相对较长的电子自旋去相干时间。我们提供的实验证据表明,在平行于导电层的电子运动二维电子气可能是由用于掺杂Si量子阱的施主产生的,这是导致在该系统中实现良好控制的点的众所周知的困难。导电层中的电荷运动会导致大面积的耗尽规模,使电子不可能被限制在点中,并会产生噪声,使单电子充电信号不堪重负。给出了表征该导电层的电容与栅极偏压的结果。

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  • 来源
    《Journal of Applied Physics》 |2011年第2期|p.023712.1-023712.5|共5页
  • 作者单位

    Department of Physics,Massachusetts Institute of Technology,Cambridge,Massachusetts 02139,USA;

    Department of Physics,Massachusetts Institute of Technology,Cambridge,Massachusetts 02139,USA;

    Department of Physics,Massachusetts Institute of Technology,Cambridge,Massachusetts 02139,USA;

    Department of Materials Science and Engineering,University of California at Los Angeles,Los Angeles,California 90095,USA;

    Department of Physics,Massachusetts Institute of Technology,Cambridge,Massachusetts 02139,USA;

    Department of Physics,Massachusetts Institute of Technology,Cambridge,Massachusetts 02139,USA;

    Department of Materials Science and Engineering,University of California at Los Angeles,Los Angeles,California 90095,USA;

    Department of Physics,Massachusetts Institute of Technology,Cambridge,Massachusetts 02139,USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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