...
首页> 外文期刊>Journal of Applied Physics >Infrared properties of randomly oriented silver nanowires
【24h】

Infrared properties of randomly oriented silver nanowires

机译:随机取向的银纳米线的红外特性

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

19%We experimentally investigated the infrared properties of a set of randomly oriented silver nanowires films deposited onto glass substrate. Infrared emission of the obtained films was characterized in the long infrared range, i.e., 8-12 μm, by observing their temperature evolution under heating regime with a focal plane array infrared camera as well as a thermocouple. The obtained experimental results showed that the infrared emission from a mesh composed of silver nanowires might be tailored by opportunely assessing preparation condition, such as the metal filling factor. From the theoretical point of view, the real and imaginary part of the electrical permittivity components were retrieved from the calculations of effective permittivities of in-plane randomly oriented metallic wires, thus giving the refractive index and extinction coefficients for the four different silver nanowires meshes. Due to the correspondence between emissivity and absorbance, the experimental results are interpreted with the reconstructed corresponding absorbance spectra, thus suggesting that these coatings are suitable for infrared signature reduction applications.
机译:19%我们通过实验研究了沉积在玻璃基板上的一组随机取向的银纳米线薄膜的红外特性。通过使用焦平面阵列红外相机以及热电偶观察加热条件下的温度演变,在长的红外范围内,即8-12μm,表征所获得的膜的红外发射。获得的实验结果表明,可以通过适当地评估制备条件,例如金属填充因子,来调整由银纳米线组成的网格的红外发射。从理论上讲,从平面内随机取向的金属线的有效介电常数的计算中检索出介电常数分量的实部和虚部,从而给出了四种不同的银纳米线网的折射率和消光系数。由于发射率和吸光度之间的对应关系,用重建的相应吸光度光谱解释了实验结果,因此表明这些涂料适用于红外特征减少的应用。

著录项

  • 来源
    《Journal of Applied Physics》 |2012年第8期|083503.1-083503.6|共6页
  • 作者单位

    Dipartimento di Scienze di Base ed Applicate per l'Ingegneria, Sapienza Universita di Roma, Via A. Scarpa 16, 00161 Roma, Italy;

    IR Detection Division, BFi OPTiLAS Italy, Via E. De Marchi 27, 00144, Roma, Italy;

    Dipartimento di Scienze di Base ed Applicate per l'Ingegneria, Sapienza Universita di Roma, Via A. Scarpa 16, 00161 Roma, Italy;

    Dipartimento di Scienze di Base ed Applicate per l'Ingegneria, Sapienza Universita di Roma, Via A. Scarpa 16, 00161 Roma, Italy;

    Dipartimento di Scienze di Base ed Applicate per l'Ingegneria, Sapienza Universita di Roma, Via A. Scarpa 16, 00161 Roma, Italy;

    Dipartimento di Scienze di Base ed Applicate per l'Ingegneria, Sapienza Universita di Roma, Via A. Scarpa 16, 00161 Roma, Italy;

    Dipartimento di Scienze di Base ed Applicate per l'Ingegneria, Sapienza Universita di Roma, Via A. Scarpa 16, 00161 Roma, Italy;

    School of Electrical Engineering SMARAD Center of Excellence, Aalto University, P.O. Box 13000, 00076 Aalto, Finland;

    Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, Puumiehenkuja 2, Espoo 00076, Finland;

    Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, Puumiehenkuja 2, Espoo 00076, Finland;

    Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, Puumiehenkuja 2, Espoo 00076, Finland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号