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首页> 外文期刊>Journal of Applied Physics >Use of lateral structures to monitor and evaluate degradation of key photovoltaic parameters in an organic bulk heterojunction material
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Use of lateral structures to monitor and evaluate degradation of key photovoltaic parameters in an organic bulk heterojunction material

机译:使用侧向结构监测和评估有机体异质结材料中关键光伏参数的退化

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摘要

Charge transport and recombination mechanisms within organic bulk heterojunction (BHJ) systems have been studied using lateral devices to perform in situ potentiometry. We have developed a simplified measurement technique using two types of lateral structures to elicit key charge transport parameters and study the time and process dependence of the carrier mobilities and their ratio. Small geometry lateral devices are used to evaluate the mobility of the slower carrier within the P3HT:PCBM material system. Larger structures with 5 in situ voltage probes are used to construct a simple potential profile of the device channel and accurately determine the carrier mobility ratio. These two measurements enable the calculation of carrier densities and the recombination coefficient. We monitor the change in these parameters as the P3HT:PCBM film degrades in the presence of oxygen and also examine the effect of the solvent additive 1,8-diiodooctane on this degradation mechanism. By exposing ethanol vapor to the BHJ film, we induce traps in the material and monitor the shift in dominant nongeminate recombination mechanism to a more unimolecular type. We are also able to measure the resulting decrease in carrier mobilities due to the presence of dipole-induced traps. Lateral devices are useful material diagnostic structures for studying degradation in BHJ materials.
机译:已经研究了使用侧向装置进行原位电势测定的有机本体异质结(BHJ)系统中的电荷传输和复合机制。我们已经开发出一种简化的测量技术,使用两种类型的横向结构来得出关键的电荷传输参数,并研究载流子迁移率及其比率与时间和过程的相关性。小型几何横向设备用于评估P3HT:PCBM材料系统中较慢的载具的迁移率。具有5个原位电压探头的较大结构可用于构建设备通道的简单电势曲线并准确确定载流子迁移率。通过这两个测量,可以计算载流子密度和重组系数。当P3HT:PCBM膜在氧气存在下降解时,我们监测这些参数的变化,并检查溶剂添加剂1,8-二碘辛烷对这种降解机理的影响。通过将乙醇蒸气暴露于BHJ膜,我们在材料中诱导了陷阱,并监控了主要非gegeming重组机制向更单分子类型的转变。我们还能够测量由于偶极感应阱的存在而导致的载流子迁移率的下降。横向装置是用于研究BHJ材料降解的有用的材料诊断结构。

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  • 来源
    《Journal of Applied Physics 》 |2014年第21期| 214507.1-214507.6| 共6页
  • 作者单位

    Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, USA,Materials Science and Engineering Program, The University of Texas at Austin, Austin, Texas 78712, USA;

    Institute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A~*STAR), 3 Research Link, Singapore 117602, Republic of Singapore;

    Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, USA,Materials Science and Engineering Program, The University of Texas at Austin, Austin, Texas 78712, USA,Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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