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Ferromagnetic resonance micromagnetic studies in patterned permalloy thin films and stripes

机译:图案化坡莫合金薄膜和条带中的铁磁共振微磁研究

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摘要

We present micromagnetic simulations of ferromagnetic resonance in patterned permalloy films and isolated stripes. Films of the total thickness 20 nm or 40 nm are patterned in the form of 1D periodic structures with rectangular profile (rectangular grooves of depth varying from zero up to the film thickness) and in-plane period of 500 nm. The direction of the applied dc magnetic field is varied in the film plane from the direction parallel to the stripes to perpendicular one. The thickness of the patterned elements and direction of the bias field affect essentially the resonance peaks (changing their position, amplitude and number) and the corresponding dynamical magnetization profiles. We simulated from one up to three ferromagnetic resonance peaks and found the areas of microwave magnetization localization for them.
机译:我们目前在图案化的坡莫合金膜和孤立的条纹中的铁磁谐振的微磁模拟。总厚度为20 nm或40 nm的薄膜以一维周期性结构的形式进行构图,该结构具有矩形轮廓(深度从零到最大直至膜厚的矩形凹槽),面内周期为500 nm。施加的直流磁场的方向在薄膜平面中从平行于条的方向变化到垂直的方向。构图元件的厚度和偏置场的方向实质上影响共振峰(改变其位置,幅度和数量)和相应的动态磁化曲线。我们模拟了一个至三个铁磁共振峰,并发现了它们的微波磁化定位区域。

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  • 来源
    《Journal of Applied Physics》 |2014年第9期|093908.1-093908.10|共10页
  • 作者单位

    Dpto. Fisica de Materiales, Universidad del Pais Vasco, UPV/EHU, 20018 San Sebastian, Spain;

    IFIMUP-IN (Institute for Nanoscience and Nanotechnology) and Departamento de Fisica,Universidade do Porto, Rua Campo Alegre 687, 4169-007 Porto, Portugal,Institute of Magnetism, National Academy of Sciences of Ukraine, 36b Vernadskogo Blvd., 03142 Kiev,Ukraine;

    Dpto. Fisica de Materiales, Universidad del Pais Vasco, UPV/EHU, 20018 San Sebastian, Spain;

    Dpto. Fisica de Materiales, Universidad del Pais Vasco, UPV/EHU, 20018 San Sebastian, Spain,IKERBASQUE, The Basque Foundation for Science, 48011 Bilbao, Spain;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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