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首页> 外文期刊>Journal of Applied Physics >Impact of surface and residual stresses and electro-/magnetostatic axial loading on the suspended nanomechanical based mass sensors: A theoretical study
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Impact of surface and residual stresses and electro-/magnetostatic axial loading on the suspended nanomechanical based mass sensors: A theoretical study

机译:表面和残余应力以及静/静磁轴向载荷对基于悬浮的纳米机械质量传感器的影响:理论研究

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摘要

Suspended nanomechanical mass sensors are capable to detect the attached molecules or particles through the shifts in the resonant frequencies. However, surface and residual stresses can as well cause a shift of the sensor resonances. As result, understanding the impact of stresses in an accuracy and sensitivity of the mass sensors is a fundamental requirement for a rigorous analysis of experimental data. Here, we present a detailed theoretical study of the suspended nanomechanical resonators and mass sensors under axial load created by surface (residual) stresses or electrostatic (magnetostatic) forces. Easily accessible formulas allowing one either to accurately predict the resonant frequencies of the beam under tension/compression or to disentangle the effects of stresses (axial forces) and the molecule mass on the frequency shift of the suspended mass sensors have been derived. A dimensionless parameter enabling us a simple characterization of the device vibrational regime (i.e., beam, string, or beam-to-string transition) has been identified. Based on the results, the applicability limits of the classical beam theory with and without axial loading have been found. We also show that tuning the beam resonant frequencies enhances the mass sensitivity.
机译:悬浮的纳米机械质量传感器能够通过共振频率的变化来检测附着的分子或粒子。但是,表面应力和残余应力也会导致传感器共振的偏移。因此,了解应力对质量传感器精度和灵敏度的影响是对实验数据进行严格分析的基本要求。在这里,我们对悬浮的纳米机械谐振器和质量传感器进行了详细的理论研究,这些轴向载荷是在由表面(残余)应力或静电(静磁)力产生的轴向载荷下产生的。得出了一种容易获得的公式,该公式可以准确地预测在拉伸/压缩下梁的共振频率,或者可以使应力(轴向力)和分子质量对悬置质量传感器的频移的影响解开。已经确定了无量纲参数,该参数使我们能够简单地表征设备的振动状态(即梁,弦或弦到弦的过渡)。根据结果​​,发现了有和没有轴向载荷的经典梁理论的适用范围。我们还表明,调整束共振频率可以提高质量灵敏度。

著录项

  • 来源
    《Journal of Applied Physics》 |2014年第21期|214310.1-214310.7|共7页
  • 作者

    Ivo Stachiv;

  • 作者单位

    Advanced Institute of Manufacturing with High-tech Innovations (AIM-HI), National Chung Cheng University, Chia-yi County, Taiwan and Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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