机译:通过敞开的电介质加载微波腔确定大面积石墨烯层的非接触薄层电阻
Department of Materials, Imperial College London, South Kensington, London SW7 2AZ, United Kingdom;
Department of Materials, Imperial College London, South Kensington, London SW7 2AZ, United Kingdom;
Department of Materials, Imperial College London, South Kensington, London SW7 2AZ, United Kingdom,National Physical Laboratory, Hampton Road, Teddington TW11 OLW, United Kingdom;
Department of Materials, Imperial College London, South Kensington, London SW7 2AZ, United Kingdom;
Department of Materials, Imperial College London, South Kensington, London SW7 2AZ, United Kingdom;
Department of Materials, Imperial College London, South Kensington, London SW7 2AZ, United Kingdom;
National Physical Laboratory, Hampton Road, Teddington TW11 OLW, United Kingdom;
National Physical Laboratory, Hampton Road, Teddington TW11 OLW, United Kingdom;
Department of Materials, Imperial College London, South Kensington, London SW7 2AZ, United Kingdom;
机译:在高T / sub c /超导薄膜的微波表面电阻测量中使用电介质加载的圆柱腔
机译:加载介质的圆柱腔在高Tc超导薄膜的微波表面电阻测量中的应用
机译:通过间隔石墨烯层来确定多层石墨烯片的耐渗透性基准
机译:微波介电双波导传感器测定基础设施健康的混凝土介电常数
机译:介电加载的微波腔,用于超导材料的高梯度测试。
机译:通过非接触微波腔扰动测量的大型封装外延石墨烯的表面电导率和介电损耗正切值的保持
机译:B5.1通过微波腔扰动法测定二氧化铈和烟灰粉的介电性能