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Thermal stability of simple tetragonal and hexagonal diamond germanium

机译:简单四方和六方金刚石锗的热稳定性

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摘要

Exotic phases of germanium, that form under high pressure but persist under ambient conditions, are of technological interest due to their unique optical and electrical properties. The thermal evolution and stability of two of these exotic Ge phases, the simple tetragonal (st12) and hexagonal diamond (hd) phases, are investigated in detail. These metastable phases, formed by high pressure decompression in either a diamond anvil cell or by nanoindentation, are annealed at temperatures ranging from 280 to 320 °C for st12-Ge and 200 to 550 °C for hd-Ge. In both cases, the exotic phases originated from entirely pure Ge precursor materials. Raman microspectroscopy is used to monitor the phase changes ex situ following annealing. Our results show that hd-Ge synthesized via a pure form of a-Ge first undergoes a subtle change in structure and then an irreversible phase transformation to dc-Ge with an activation energy of (4.3 ± 0.2) eV at higher temperatures. St12-Ge was found to transform to dc-Ge with an activation energy of (1.44 ± 0.08) eV. Taken together with results from previous studies, this study allows for intriguing comparisons with silicon and suggests promising technological applications.
机译:锗的异质相在高压下形成,但在环境条件下仍然存在,由于其独特的光学和电学性质,在技术上引起了人们的兴趣。详细研究了这两种奇异的Ge相的热演化和稳定性,即简单的四方相(st12)和六边形菱形(hd)。这些亚稳相是由金刚石砧室中的高压减压作用或纳米压痕形成的,在st12-Ge的温度范围从280至320°C,hd-Ge的温度范围在200至550°C进行退火。在这两种情况下,异质相均来自完全纯净的Ge前驱体材料。拉曼光谱法用于监测退火后非原位的相变。我们的结果表明,通过纯a-Ge形式合成的hd-Ge首先在结构上发生细微变化,然后在较高温度下以(4.3±0.2)eV的活化能不可逆地转变为dc-Ge。发现St12-Ge以(1.44±0.08)eV的激活能转变为dc-Ge。结合以前的研究结果,这项研究可以与硅进行有趣的比较,并提出有希望的技术应用。

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  • 来源
    《Journal of Applied Physics 》 |2017年第17期| 175108.1-175108.7| 共7页
  • 作者单位

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Acton, ACT, Australia;

    School of Physics, University of Melbourne, VIC, Australia;

    Neutron Scattering Division, Neutron Sciences Direc., Oak Ridge National Laboratory, Oak Ridge, TN, United States;

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Acton, ACT, Australia,School of Science, RMIT University, GPO Box 2476V, Melbourne, VIC, Australia;

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Acton, ACT, Australia;

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Acton, ACT, Australia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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