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机译:Ga注入SiC中的点缺陷:实验与理论
ABB Corporate Research, Segelhofstrasse IK, 5405 Baden-Daettwil, Switzerland;
ABB Corporate Research, Segelhofstrasse IK, 5405 Baden-Daettwil, Switzerland;
ABB Corporate Research, Segelhofstrasse IK, 5405 Baden-Daettwil, Switzerland;
ABB Corporate Research, Segelhofstrasse IK, 5405 Baden-Daettwil, Switzerland;
ABB Corporate Research, Segelhofstrasse IK, 5405 Baden-Daettwil, Switzerland;
机译:SiC / Al复合材料中SiC的最佳浓度:上下限的实验和渗流理论预测
机译:建构主义接地理论研究,通过患有护理(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)的个人来探讨同情 )(SiC),(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC)(SiC) 。
机译:Si(100)上Mn注入的3c-sic外延层的缺陷和磁性能:实验和第一性原理计算
机译:SiC的缺陷:理论
机译:用深层瞬态光谱法(DLTS)表征4H-SiC的缺陷及其对器件性能的影响
机译:SiC单层的气敏特性和双层:密度泛函理论研究
机译:揭示准自立式单层中缺陷的性质 石墨烯在siC(0001)上的密度泛函理论
机译:siC衬底上生长的外延3C-siC,4H-siC和6H-siC薄膜缺陷的研究