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Fluorosilicene/chlorosilicene bilayer semiconductor with tunable electronic and optical properties

机译:具有可调电子和光学特性的氟硅/氯硅双层半导体

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摘要

Using comprehensive density functional theory calculations, the structural, electronic, and optical properties of novel fluorosilicene/chlorosilicene (F-silicene/Cl-silicene) heterobilayer are investigated. Our results unveil that the presence of hetero-halogen bonding (Si-F--Cl-Si) has a remarkable influence on the F-silicene/Cl-silicene bilayer. The F-silicene/Cl-silicene heterostructure in the most stable pattern has a moderate band gap of 0.309 eV, lower than that of isolated halogenated silicene. Encouragingly, F-silicene/Cl-silicene heterobilayers all have a direct band gap nature, irrespective of the stacking pattern, thickness and external electric fields (E-fields), which is an advantage over MoS_2 layers. In addition, applying appropriate E-field leads to a significant enhancement of binding strength of the F-silicene/Cl-silicene heterobilayer. Especially, the band gap of the F-silicene/Cl-silicene heterobilayer can be effectively modulated by E-fields, even a semiconductor-metal transition occurs. Moreover, the interfacial hetero-halogen interaction changes the optical properties of isolated halogenated silicene; the adsorption edge of imaginary part of the dielectric function displays a corresponding redshift in comparison with that of isolated halogenated silicene, which makes the F-silicene/Cl-silicene heterostructure active over the visible range. The complete electron-hole separation also enhances the photocatalytic efficiency of the F-silicene/Cl-silicene heterobilayer. Overall, the moderate band gap, effective band gap modification by external E-field, robust direct band gap nature, suitable band edge positions, and type-II band alignment enable the F-silicene/Cl-silicene heterobilayer to have great potential applications in the field of optical and nanoelectronic devices.
机译:使用综合密度泛函理论计算,研究了新型氟硅/氯硅(F-硅/ Cl-硅)异质双层的结构,电子和光学性质。我们的结果表明,杂卤键(Si-F--Cl-Si)的存在对F-硅/ Cl-硅双层具有显着影响。最稳定的图案中的F-硅/ Cl-硅异质结构的中带隙为0.309 eV,低于分离的卤化硅的带隙。令人鼓舞的是,与堆叠图案,厚度和外部电场(电场)无关,F-硅/ Cl-硅异质双层都具有直接的带隙性质,这是优于MoS_2层的一个优点。另外,施加适当的电场导致F-硅树脂/ Cl-硅树脂异质​​双分子层的结合强度显着提高。特别地,即使发生半导体-金属跃迁,也可以通过电场有效地调节F-硅/ Cl-硅异质双层的带隙。而且,界面杂卤素相互作用改变了分离的卤化硅的光学性质。与孤立的卤代硅烯相比,介电功能虚部的吸附边缘显示出相应的红移,这使得F-硅/ Cl-硅异质结构在可见光范围内具有活性。完全的电子-空穴分离还提高了F-硅/ Cl-硅异质双分子层的光催化效率。总体而言,适度的带隙,外部电场对带隙的有效修饰,稳固的直接带隙性质,合适的能带边缘位置以及II型能带对准特性使F-silicene / Cl-silicene异质双分子层具有广阔的应用前景。光学和纳米电子设备领域。

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  • 来源
    《Journal of Applied Physics》 |2017年第5期|055701.1-055701.8|共8页
  • 作者单位

    Faculty of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, 541004 Guilin, China,Key Laboratory of Optoelectronic Technology and Systems, Education Ministry of China, Chongqing University and College of Optoelectronic Engineering, Chongqing University, 400044 Chongqing, China,Institute of Optoelectronics and Nanomaterials, College of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China;

    Institute of Optoelectronics and Nanomaterials, College of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China;

    Faculty of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, 541004 Guilin, China,Key Laboratory of Optoelectronic Technology and Systems, Education Ministry of China, Chongqing University and College of Optoelectronic Engineering, Chongqing University, 400044 Chongqing, China;

    Faculty of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, 541004 Guilin, China;

    Key Laboratory of Optoelectronic Technology and Systems, Education Ministry of China, Chongqing University and College of Optoelectronic Engineering, Chongqing University, 400044 Chongqing, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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