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首页> 外文期刊>Journal of Applied Physics >Revealing mechanisms of PL properties at high and low temperature regimes in CdSe/ZnS core/shell quantum dots
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Revealing mechanisms of PL properties at high and low temperature regimes in CdSe/ZnS core/shell quantum dots

机译:CdSe / ZnS核/壳量子点在高温和低温下PL特性的揭示机理

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摘要

Here, we report on the strong temperature dependence of PL properties in CdSe/ZnS core/shell quantum dots, within a broad temperature range of 80-500 K. Our results demonstrate different PL quenching mechanisms in high and low temperature ranges. In the low temperature range of below 320 K, PL quenching is proved to be dominated by thermally activated carrier escape. While in the high temperature range of above 320 K, PL undergoes additional quenching because of surface trapping by the thermally created surface defects, which is calculated and proved by the rapidly decreasing PL lifetime. Our calculating result proves that the model of thermally activated carrier escape is also responsible for PL quenching in the high temperature range. However, the red-shifted PL peak energy and the broadened FWHM with increasing temperature follow the same mechanisms in the whole temperature range. The former is due to the temperature-dependent bandgap shrinkage and the latter is due to the exciton scattering with acoustic and longitudinal-optical phonons. Published by AIP Publishing.
机译:在这里,我们报道了在80-500 K的宽温度范围内CdSe / ZnS核/壳量子点中PL特性对温度的强烈依赖性。我们的结果证明了在高温和低温范围内不同的PL猝灭机理。在低于320 K的低温范围内,PL淬灭被证明是由热活化载流子逸出所主导。在高于320 K的高温范围内,由于受到热产生的表面缺陷的表面俘获,PL受到了额外的淬火,这可以通过PL寿命的快速降低来计算和证明。我们的计算结果证明,热活化载流子逸出模型还负责高温范围内的PL猝灭。然而,红移的PL峰值能量和随温度升高而变宽的FWHM在整个温度范围内遵循相同的机理。前者归因于温度相关的带隙收缩,而后者归因于声子和纵光声子的激子散射。由AIP Publishing发布。

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  • 来源
    《Journal of Applied Physics 》 |2018年第4期| 044302.1-044302.6| 共6页
  • 作者单位

    Harbin Inst Technol, Dept Phys, Harbin 150001, Heilongjiang, Peoples R China;

    Harbin Inst Technol, Dept Phys, Harbin 150001, Heilongjiang, Peoples R China;

    Harbin Inst Technol, Dept Phys, Harbin 150001, Heilongjiang, Peoples R China;

    Harbin Inst Technol, Dept Phys, Harbin 150001, Heilongjiang, Peoples R China;

    Harbin Inst Technol, Dept Phys, Harbin 150001, Heilongjiang, Peoples R China;

    Harbin Inst Technol, Dept Phys, Harbin 150001, Heilongjiang, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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