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Hexagonal boron nitride neutron detectors with high detection efficiencies

机译:具有高检测效率的六方氮化硼中子探测器

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摘要

Neutron detectors fabricated from ~(10)B enriched hexagonal boron nitride (h-~(10)BN or h-BN) epilayers have demonstrated the highest thermal neutron detection efficiency among solid-state neutron detectors to date at about 53%. In this work, photoconductive-like vertical detectors with a detection area of 1 × 1 mm~2 were fabricated from 50 μm thick free-standing h-BN epilayers using Ni/Au and Ti/Al bilayers as ohmic contacts. Leakage currents, mobility-lifetime (μτ) products under UV photoexcitation, and neutron detection efficiencies have been measured for a total of 16 different device configurations. The results have unambiguously identified that detectors incorporating the Ni/Au bilayer on both surfaces as ohmic contacts and using the negatively biased top surface for neutron irradiation are the most desired device configurations. It was noted that high growth temperatures of h-~(10)BN epilayers on sapphire substrates tend to yield a higher concentration of oxygen impurities near the bottom surface, leading to a better device performance by the chosen top surface for irradiation than by the bottom. Preferential scattering of oxygen donors tends to reduce the mobility of holes more than that of electrons, making the biasing scheme with the ability of rapidly extracting holes at the irradiated surface while leaving the electrons to travel a large average distance inside the detector at a preferred choice. When measured against a calibrated LiF filled micro-structured semiconductor neutron detector, it was shown that the optimized configuration has pushed the detection efficiency of h-BN neutron detectors to 58%. These detailed studies also provided a better understanding of growth-mediated impurities in h-BN epilayers and then-effects on the charge collection and neutron detection efficiencies.
机译:由〜(10)B富集的六方氮化硼(h-〜(10)BN或h-BN)外延层制成的中子探测器已证明在固态中子探测器中迄今为止最高的热中子探测效率约为53%。在这项工作中,使用Ni / Au和Ti / Al双层作为欧姆接触,由50μm厚的独立h-BN外延层制造了检测面积为1×1 mm〜2的类似光电导的垂直探测器。对于总共16种不同的设备配置,已经测量了泄漏电流,在紫外光激发下的迁移率-寿命(μτ)产品以及中子检测效率。结果已明确确定,最需要的设备配置是在两个表面上均将Ni / Au双层作为欧姆接触并使用负偏压顶表面进行中子辐照的探测器。值得注意的是,蓝宝石衬底上的h-〜(10)BN外延层的高生长温度趋于在底表面附近产生更高浓度的氧杂质,从而导致所选择的顶表面进行辐照比底表面具有更好的器件性能。 。氧供体的优先散射往往会比电子更能减少空穴的迁移率,从而使偏光方案能够在被辐照的表面上迅速提取空穴,同时使电子在检测器内以较大的平均距离传播,这是一种优选的选择。当用校准的LiF填充的微结构半导体中子探测器进行测量时,结果表明,优化的配置将h-BN中子探测器的探测效率提高到58%。这些详细的研究还提供了对h-BN外延层中生长介导的杂质以及电荷收集和中子检测效率的影响的更好理解。

著录项

  • 来源
    《Journal of Applied Physics》 |2018年第4期|044501.1-044501.8|共8页
  • 作者单位

    Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA;

    Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA;

    Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA;

    Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA;

    Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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