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Single charging events on colloidal particles in a nonpolar liquid with surfactant

机译:具有表面活性剂的非极性液体中胶体颗粒的单次充电事件

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摘要

Electrical charging of colloidal particles in nonpolar liquids due to surfactant additives is investigated intensively, motivated by its importance in a variety of applications. Most methods rely on average electrophoretic mobility measurements of many particles, which provide only indirect information on the charging mechanism. In the present work, we present a method that allows us to obtain direct information on the charging mechanism, by measuring the charge fluctuations on individual particles with a precision higher than the elementary charge using optical trapping electrophoresis. We demonstrate the capabilities of the method by studying the influence of added surfactant OLOA 11000 on the charging of single colloidal PMMA particles in dodecane. The particle charge and the frequency of charging events are investigated both below and above the critical micelle concentration (CMC) and with or without applying a DC offset voltage. It is found that at least two separate charging mechanisms are present below the critical micelle concentration. One mechanism is a process where the particle is stripped from negatively charged ionic molecules. An increase in the charging frequency with increased surfactant concentration suggests a second mechanism that involves single surfactant molecules. Above the CMC, neutral inverse micelles can also be involved in the charging process.
机译:由于表面活性剂添加剂在非极性液体中使胶体颗粒带电,因此对其进行了广泛的研究,其动力在于其在各种应用中的重要性。大多数方法依赖于许多粒子的平均电泳迁移率测量,这些测量仅提供有关充电机制的间接信息。在当前的工作中,我们提出了一种方法,该方法使我们能够通过使用光阱电泳以高于单质电荷的精度测量单个粒子上的电荷波动来获得有关电荷机制的直接信息。我们通过研究添加的表面活性剂OLOA 11000对十二烷中单个胶体PMMA颗粒的充电的影响,证明了该方法的功能。在临界胶束浓度(CMC)之下和之上,以及是否施加直流偏移电压的情况下,都研究了粒子电荷和充电事件的频率。发现在临界胶束浓度以下存在至少两种单独的充电机制。一种机制是从带负电荷的离子分子中剥离颗粒的过程。随着表面活性剂浓度的增加,充电频率的增加表明了涉及单个表面活性剂分子的第二种机理。在CMC上方,中性反胶束也可以参与充电过程。

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  • 来源
    《Journal of Applied Physics》 |2018年第1期|015105.1-015105.9|共9页
  • 作者单位

    Electronics and Information Systems, Ghent University, Technologiepark-Zwijnaarde 15, 9052 Gent, Belgium;

    Electronics and Information Systems, Ghent University, Technologiepark-Zwijnaarde 15, 9052 Gent, Belgium;

    Electronics and Information Systems, Ghent University, Technologiepark-Zwijnaarde 15, 9052 Gent, Belgium;

    Electronics and Information Systems, Ghent University, Technologiepark-Zwijnaarde 15, 9052 Gent, Belgium;

    Electronics and Information Systems, Ghent University, Technologiepark-Zwijnaarde 15, 9052 Gent, Belgium;

    Electronics and Information Systems, Ghent University, Technologiepark-Zwijnaarde 15, 9052 Gent, Belgium;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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