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A compact 3D micro X-ray fluorescence spectrometer with X-ray tube excitation for archaeometric applications

机译:带有X射线管激发的紧凑型3D微型X射线荧光光谱仪,用于考古学应用

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摘要

In this work, the applicability of a new 3D micro X-ray fluorescence (3D Micro-XRF) laboratory spectrometer for the investigation of historical glass objects is demonstrated. The non-destructiveness of the technique and the possibility to measure three-dimensionally resolved fluorescence renders this technique into a suitable tool for the analysis of cultural heritage objects. Although absorption and resolution effects complicate qualitative analysis of the data, layered structures can be distinguished from homogeneous samples without the need for full quantification. Different manufacturing techniques were studied in this work with the help of hand-made reference samples. With the gained knowledge it could be shown for the investigated historical glass object, that black enamel as a stained glass contour colour was used in a cold painting. The object was not fired after the application of the black enamel, but instead the adhesion of the paint was solely provided through organic binding agents and the backing with metal foils. Thus, for the manufacturing of the object, a mixture of cold painting technique with a stained glass color was used. Quantitative measurements with a 3D Micro-XRF setup at the Berlin synchrotron BESSY II confirm the assumptions drawn on the basis of the qualitative investigation with the 3D Micro-XRF spectrometer with X-ray tube excitation.
机译:在这项工作中,展示了一种新型3D微型X射线荧光(3D Micro-XRF)实验室光谱仪在研究历史玻璃物体方面的适用性。该技术的无损性和测量三维分辨荧光的可能性使该技术成为分析文化遗产对象的合适工具。尽管吸收和分离效应使数据的定性分析复杂化,但可以将层状结构与均质样品区分开,而无需进行完全定量。在手工制作的参考样品的帮助下,这项工作研究了不同的制造技术。有了所获得的知识,就可以证明对历史玻璃物体的研究是在冷漆中使用黑色搪瓷作为彩色玻璃轮廓色。涂上黑色搪瓷后未烧成该物体,而是仅通过有机粘合剂和带有金属箔的背衬提供涂料的附着力。因此,为了制造物体,使用了具有彩色玻璃颜色的冷喷涂技术的混合物。在柏林同步加速器BESSY II上使用3D Micro-XRF装置进行的定量测量证实了基于在3D Micro-XRF光谱仪和X射线管激励下进行定性研究得出的假设。

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  • 来源
    《Journal of Analytical Atomic Spectrometry》 |2010年第4期|p.554-561|共8页
  • 作者单位

    Institute for Optics and Atomic Physics, Technische Universitaet Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany;

    Institute for Optics and Atomic Physics, Technische Universitaet Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany;

    Institute for Optics and Atomic Physics, Technische Universitaet Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany BAM Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin, Germany;

    Institute for Scientific Instruments GmbH, Rudower Chaussee 29/31, 12489 Berlin, Germany;

    Institute for Optics and Atomic Physics, Technische Universitaet Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany BAM Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin, Germany;

    Institute for Scientific Instruments GmbH, Rudower Chaussee 29/31, 12489 Berlin, Germany;

    BAM Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin, Germany;

    Institute for Optics and Atomic Physics, Technische Universitaet Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany;

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