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Atmospheric helium capillary dielectric barrier discharge for soft ionization: broadening of spectral lines, gas temperature and electron number density

机译:大气氦毛细管电介质势垒放电,实现软电离:光谱线,气体温度和电子数密度的扩展

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摘要

The capillary helium dielectric barrier discharge (DBD) operating at atmospheric pressure was investigated by means of optical emission spectroscopy with the aim to determine the dominant broadening mechanism of the helium spectral lines, gas temperature and electron number density. The dependence of emission profiles of helium 388 nm, 501 nm, 587 nm, 667 nm, 706 nm and 728 nm lines on discharge voltage, helium pressure and position along the DBD capillary was investigated. Also, the pressure and voltage dependence of the profiles of hydrogen H-alpha and H-beta lines was examined. The Lorentzian widths of the normalized helium line profiles were found to be constant with respect to the applied voltage and the position along the capillary. The dominant broadening mechanism for all investigated lines was identified to be due to collisions with ground-state helium atoms, with the Stark broadening being negligible. It was determined that the temperature of the gas was constant along the capillary and independent of the voltage applied on the DBD electrodes and that its value coincided with the room temperature. The measurements of the dependence of the Lorentzian width of hydrogen H-alpha and H-beta lines on helium pressure, combined with gas temperature determined in the experiment, yielded the following values for the broadening parameters due to broadening by neutral helium: r_(He)~v (H_α) = 1.56 × 10~(-9) cm~3 s~(-1) and r_(He)~v H_β) = 3.16 × 10~(-9) cm~3 s~(-1). From the analysis of the measured H-alpha and H-beta line profiles the upper limit of the electron number density in the investigated plasma was obtained as n_e ≤ 1.4× 10~(12) cm~(-3).
机译:通过光发射光谱法研究了在大气压下工作的毛细管氦介电势垒放电(DBD),目的是确定氦谱线,气体温度和电子数密度的主要加宽机理。研究了388 nm,501 nm,587 nm,667 nm,706 nm和728 nm线的氦气发射曲线对放电电压,氦气压力和沿DBD毛细管的位置的依赖性。此外,检查了氢H-α和H-β谱线的压力和电压依赖性。发现归一化氦线轮廓的洛伦兹宽度相对于施加的电压和沿毛细管的位置是恒定的。所有研究线的主要展宽机制被确定是由于与基态氦原子的碰撞所致,而斯塔克展宽可忽略不计。已确定气体的温度沿毛细管是恒定的,并且与施加在DBD电极上的电压无关,并且其值与室温一致。测量氢气H-alpha和H-beta线的洛伦兹宽度对氦气压力的依赖性,并结合实验中确定的气体温度,由于中性氦气的展宽,得出了以下展宽参数值:r_(He )〜v(H_α)= 1.56×10〜(-9)cm〜3 s〜(-1)和r_(He)〜vH_β)= 3.16×10〜(-9)cm〜3 s〜(-1 )。通过对测得的H-α和H-β谱线的分析,得出研究等离子体中电子数密度的上限为n_e≤1.4×10〜(12)cm〜(-3)。

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  • 来源
    《Journal of Analytical Atomic Spectrometry》 |2014年第3期|498-505|共8页
  • 作者单位

    Institute of Physics, Bijenicka 46, 10000 Zagreb, Croatia;

    ISAS-Leibniz Institut fuer analytische Wissenschaften, Bunsen-Kirchhoff-Str. 11, 44139 Dortmund, Germany;

    Department of Physics, Faculty of Science, University of Zagreb, Bijenicka 32,10000 Zagreb, Croatia;

    Institute of Physics, Bijenicka 46, 10000 Zagreb, Croatia;

    ISAS-Leibniz Institut fuer analytische Wissenschaften, Bunsen-Kirchhoff-Str. 11, 44139 Dortmund, Germany;

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