Synthesis and Microwave Dielectric Properties of Sm_2SiO_5 Ceramics

摘要

The Sm_2SiO_5 ceramics were synthesized and their microwave dielectric properties were investigated. The pure monoclinic Sm_2SiO_5 phase could be obtained when the molar ratio of Sm_2O_3/SiO_2 was 1:1.05 at 1350℃. A small amount of hexagonal Sm_4(SiO_4)_3 second phase occurred as temperature increased. The relative density of Sm_2SiO_5 ceramics increased with increasing temperature. The Sm_2SiO_5 ceramics sintered at 1500℃ exhibited microwave dielectric properties: a dielectric constant (ε_r) of 8.44, a quality factor (Q × f) of 64 000 GHz, and a temperature coefficient of resonant frequency (τ_f) of -37 ppm/℃. The Sm_2SiO_5 ceramics have a wide sintering temperature region and small negative τ_f values. They are promising candidate materials for millimeter-wave devices.