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Dysprosium-Doped (Ba,Sr)TiO_3 Thin Films on Nickel Foils for Capacitor Applications

机译:电容器用镍箔上掺的(Ba,Sr)TiO_3薄膜

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摘要

The substitution in (Ba_(0.70)Sr_(0.30)TiO_3 thin films by the rare-earth element dysprosium prepared at 1000℃ by chemical solution deposition on nickel foils was investigated. The relatively large thermal budget applied (via annealing temperature) is shown to enhance the solubility of the Dy~(3+)doping ion into the crystal lattice of the perovskite films. Preference for B-site occupancy of this amphoteric cation was further promoted by the addition of BaO excess (1 mol%), which results in slightly larger grains in the films as observed by scanning electron microscopy. Despite this Ba-rich composition, the presence of secondary phases in the thin films was not detected by X-ray diffraction. Transmission electron microscopy revealed no evidence for local segregation of Dy at grain boundaries, neither the formation of NiO at the interface between the film and the metal foil was observed. The substitution of Ti~(4+) by Dy~(3 +) leads to the formation of strong electron acceptors in the system, which balance the number of ionized oxygen vacancies arisen from the reductive crystallization atmosphere used during processing. As a consequence, the dielectric loss (tan a) and leakage conduction measured in the resulting thin-film capacitors were significantly reduced with respect to nominally undoped samples. The improvement of this capacitor feature, combined with the relatively high permittivities obtained in the films (490-530), shows the effectiveness of dysprosium doping within a thin-film fabrication method for potential application into the multilayer ceramic capacitor technology.
机译:研究了在镍箔上化学溶液沉积在1000℃下制备的稀土元素在(Ba_(0.70)Sr_(0.30)TiO_3薄膜中的替代作用,结果表明,施加较大的热预算(通过退火温度)为:通过增加过量的BaO(1 mol%)进一步增加了Dy〜(3+)掺杂离子在钙钛矿薄膜晶格中的溶解度,进一步促进了该两性阳离子在B位的占据。通过扫描电子显微镜观察发现,薄膜中的晶粒稍大;尽管具有这种富含钡的成分,但是通过X射线衍射未检测到薄膜中存在第二相;透射电子显微镜没有显示Dy在局部偏析的证据。晶界,在薄膜和金属箔之间的界面上都没有观察到NiO的形成,Dy〜(3 +)取代了Ti〜(4+)导致了强势电子受体的形成。茎,它平衡了在加工过程中使用的还原性结晶气氛中产生的电离氧空位的数量。结果,相对于标称未掺杂的样品,在所得薄膜电容器中测得的介电损耗(tan a)和泄漏传导大大降低。这种电容器特性的改进,加上在薄膜中获得的相对较高的介电常数(490-530),显示出within掺杂在薄膜制造方法中的有效性,可用于多层陶瓷电容器技术。

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  • 来源
    《Journal of the American Ceramic Society》 |2013年第4期|1228-1233|共6页
  • 作者单位

    Institut fur Werkstoffe der Elektrotechnik II & JARA-FIT, RWTH Aachen, D-52074 Aachen, Germany;

    Institut fur Werkstoffe der Elektrotechnik II & JARA-FIT, RWTH Aachen, D-52074 Aachen, Germany;

    Institut fur Werkstoffe der Elektrotechnik II & JARA-FIT, RWTH Aachen, D-52074 Aachen, Germany;

    Peter Griinberg Institut, Elektronische Materialen & JARA-FIT, Forschungszentrum Julich GmbH,D-52425 Julich, Germany;

    Gemeinschaftslabor fur Elektronenmikroskopie, RWTH Aachen, D-52074 Aachen, Germany;

    Gemeinschaftslabor fur Elektronenmikroskopie, RWTH Aachen, D-52074 Aachen, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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