Direct observation of carrier transport in organic-inorganic hybrid perovskite thin film by transient photoluminescence imaging measurement

摘要

Direct observation of the carrier motion in electronic materials is helpful for understanding the phenomena of carrier transport and the operating mechanism of a device. Transient photoluminescence (PL) imaging is conducted to directly observe the carrier motion in organic-inorganic hybrid perovskite thin film. The PL intensity of perovskite films changes in accordance with the injection and extraction of charges during application of a voltage to a methylammonium lead iodide (CH(3)NH(3)Pbl(3)) FET. The transient change in the PL intensity in the FET channel represents a successful visualization of the carrier transport. Lateral time-of-flight (TOF) measurement proves that the transient change in PL corresponds to the carrier transport. The hole mobility of the perovskite thin film could be evaluated as 2.3 x 10(-2)cm(2) V(-1)s(-1) by analyzing the transient PL motion. An increase in the PL intensity on application of a negative voltage to the source electrode indicates that intrinsic holes predominantly exist throughout the film. (C) 2019 The Japan Society of Applied Physics