Time-of-Flight Measurement of Lateral Carrier Mobility in Organic Thin Films

摘要

Lateral carrier transport in a copper phthalocyanine (CuPc) thin film has been investigated by the time-of-flight technique using a micro-excitation system. Drift mobility in the CuPc film has been estimated from the transient photocurrent measured for various electric field strengths. The drift mobility has been compared to the field-effect mobility of a thin-film transistor with CuPc as the channel material. The field-effect mobility was comparable to the drift mobility measured by the TOF technique.