首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Mechanism of Capacitance Aging under DC Electric Fields in Multilayer Ceramic Capacitors with X7R Characteristics
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Mechanism of Capacitance Aging under DC Electric Fields in Multilayer Ceramic Capacitors with X7R Characteristics

机译:具有X7R特性的多层陶瓷电容器在直流电场下电容老化的机理

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摘要

Capacitance aging under DC electric fields has been studied on multilayer ceramic capacitors (MLCCs) with X7R characteristics. The capacitance change with time was divided into two consecutive stages. The first stage was due to the nonlinear permittivity of dielectrics and it should not be involved in the aging phenomenon. The second stage depended on the MnO content, grain size and firing conditions of the dielectrics. The aging was markedly depressed above the Curie temperature. From the behavior of the second stage, it was concluded that the capacitance aging is caused by the 90° domain switching in BaTiO_3 in the core. An equation that represents the aging behavior in the second stage was presented and the mechanism that explains the capacitance aging was proposed. The first stage was due to the nonlinear permittivity and the second stage was due to the domain switching, but the domain switching was also included in the first stage if the domain walls were moved by the first application of a DC field. The change in the aging behavior with the intensity of the DC field could be explained by separating capacitance change into that due to the nonlinear permittivity and that due to the domain switching according to the mechanism proposed in this study. Finally, a methodology for handling the capacitance aging under DC fields was proposed.
机译:已经研究了具有X7R特性的多层陶瓷电容器(MLCC)在直流电场下的电容老化。电容随时间的变化分为两个连续的阶段。第一阶段是由于电介质的非线性介电常数引起的,因此不应参与老化现象。第二阶段取决于MnO含量,晶粒尺寸和电介质的烧结条件。在居里温度以上,老化显着降低。从第二阶段的行为可以得出结论,电容老化是由芯内BaTiO_3中的90°域切换引起的。提出了代表第二阶段老化行为的方程式,并提出了解释电容老化的机理。第一阶段归因于非线性介电常数,第二阶段归因于畴切换,但是如果畴壁通过直流电场的首次施加而移动,则畴切换也包括在第一阶段中。根据本研究提出的机制,可以通过将电容变化分为由于非线性介电常数引起的电容变化和由于域介电常数引起的畴变化,来解释老化行为随直流电场强度的变化。最后,提出了一种处理直流场下电容老化的方法。

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