首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters >Si Island Formation on Domain Boundaries Induced by Ar Ion Irradiation on High-Temperature Si(111)-7 x 7 Dimer-Adatom-Stacking Fault Surfaces
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Si Island Formation on Domain Boundaries Induced by Ar Ion Irradiation on High-Temperature Si(111)-7 x 7 Dimer-Adatom-Stacking Fault Surfaces

机译:高温Si(111)-7 x 7 Dimer-Adatom-stacking断面上由Ar离子辐照引起的畴边界上的Si岛形成

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摘要

Using a low-energy ion gun/high-temperature scanning tunneling microscope combined system (IG/STM), we observed the atomic scale behavior of a Si surface kept at 500℃ before, during and after Ar ion irradiation. We found that Si islands grew up within ion irradiation selectively along the boundaries of domains of 7 x 7 dimer-adatom-stacking (DAS) faults. The Si islands were 1 double atomic layer high and had the 7 x 7 DAS reconstruction. The area of the islands increased linearly with ion doses up to 2.5 x 10~(14) cm~(-2).
机译:使用低能离子枪/高温扫描隧道显微镜组合系统(IG / STM),我们观察了在Ar离子辐照之前,期间和之后,保持在500℃的Si表面的原子尺度行为。我们发现,Si岛在离子辐照下选择性地沿着7 x 7二聚体-原子堆积(DAS)断层域的边界长大。硅岛高1个双原子层,并进行了7 x 7 DAS重建。岛的面积随着离子剂量的增加而线性增加,最大为2.5 x 10〜(14)cm〜(-2)。

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