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Temperature Dependences of Spin-Diffusion Lengths of Cu and Ru layers

机译:铜和钌层自旋扩散长度的温度依赖性

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摘要

Ferromagnetic resonance (FMR) was measured in Cu/Ni_(80)Fe_(20)ormal-metal: NM (d)/Pt, Cu/Ni_(80)Fe_(20)/NM (d) films with various d values to clarify the temperature dependence of spin-diffusion length induced by the precession of magnetization on Gilbert damping. The films were fabricated by rf magnetron sputtering. The out-of-plane angular dependences of FMR resonance field and linewidth were analyzed using a Landau-Lifshitz-Gilbert equation, and the Gilbert damping parameter G of NiFe was obtained. The obtained spin-diffusion lengths λ_(SD) were 350 and 950 nm at 300 and 4.5 K, respectively. The spin-flip probability of the Cu layer was obtained using the temperature dependence of FMR linewidth. These results were then compared with the calculated data of the temperature dependence of spin-diffusion length.
机译:在具有不同d值的Cu / Ni_(80)Fe_(20)/普通金属:NM(d)/ Pt,Cu / Ni_(80)Fe_(20)/ NM(d)膜中测量铁磁共振(FMR)阐明磁化旋进对吉尔伯特阻尼引起的自旋扩散长度的温度依赖性。该膜是通过射频磁控溅射制备的。利用Landau-Lifshitz-Gilbert方程分析了FMR共振场与线宽的面外角度依赖性,得到了NiFe的Gilbert阻尼参数G。所获得的自旋扩散长度λ_(SD)在300和4.5K下分别为350和950nm。使用FMR线宽的温度依赖性获得Cu层的自旋翻转概率。然后将这些结果与自旋扩散长度的温度依赖性的计算数据进行比较。

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