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首页> 外文期刊>Japanese journal of applied physics >Design and Fabrication of Structural Color Filters with Polymer-Based Guided-Mode Resonant Gratings by Nanoimprint Lithography
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Design and Fabrication of Structural Color Filters with Polymer-Based Guided-Mode Resonant Gratings by Nanoimprint Lithography

机译:纳米压印光刻技术设计和制造基于聚合物的导模共振光栅的结构滤色片

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摘要

We investigate structural color filters theoretically and experimentally using polymer-based guided-mode resonant gratings fabricated by nanoimprint lithography. Each grating area is 200 × 200μm~2, which is a suitable pixel size for displays and multichannel detectors. In the mold fabrication, electron beam lithography and fast atom beam etching are used. The grating periods are 600,350, and 300 nm for the red, green, and blue filters, respectively. Reflectivity is measured as a function of wavelength. The wavelength at peak reflectivity is proportional to the grating period as expected from the calculated results. At a wavelength of 572.0 nm, maximum reflectivity of 58.3% is obtained for the 400-nm-period grating with a bandwidth of 17.5nm.
机译:我们在理论上和实验上使用由纳米压印光刻技术制造的基于聚合物的导模谐振光栅研究结构滤色镜。每个光栅面积为200×200μm〜2,这对于显示器和多通道检测器来说是合适的像素大小。在模具制造中,使用电子束光刻和快速原子束蚀刻。红色,绿色和蓝色滤光片的光栅周期分别为600,350和300 nm。反射率是波长的函数。根据计算结果,峰值反射率下的波长与光栅周期成正比。在波长为572.0 nm的情况下,带宽为17.5nm的400 nm周期光栅的最大反射率达到58.3%。

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  • 来源
    《Japanese journal of applied physics》 |2009年第6issue2期|06FH04.1-06FH04.4|共4页
  • 作者单位

    Department of Nanomechanics, Tohoku University, 6-6-01 Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan;

    Department of Nanomechanics, Tohoku University, 6-6-01 Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan;

    I-trix Corporation, Shirokanedai Crest 9F, 4-2-11 Shirokanedai, Minato, Tokyo 108-0071, Japan;

    I-trix Corporation, Shirokanedai Crest 9F, 4-2-11 Shirokanedai, Minato, Tokyo 108-0071, Japan;

    Department of Nanomechanics, Tohoku University, 6-6-01 Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan;

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