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Design of Compatible Optics for Solid-Immersion-Lens-Based Near-Field Recording System and Blu-ray Disc Using Relay Lens

机译:基于中继透镜的基于固态浸没透镜的近场记录系统和蓝光光盘的兼容光学设计

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摘要

We designed compatible optics for a solid-immersion-lens (SIL)-based near-field recording (NFR) system and a Blu-ray disc (BD). The working distance, numerical aperture (NA), and cover layer thickness of the SIL-based NFR system differ from those of BD. Therefore, for the compatibility of a cover layer incident type NFR system of whose NA is 1.46 and BD, we use a relay lens that is composed of two low-NA lenses. The optical tolerances such as decenter, tilt, and SIL thickness tolerances are considered to ensure manufacturability. The decenter and tilt tolerances of each optical component are greater than 1.0 μm and 0.1° respectively. The tolerance of the SIL thickness range is 14 μm at the criterion of the wavefront aberration of 0.035 λ_(rms). We design the optical layout and simulate each focus error signal of BD and the SIL-based NFR system. From the practical design results, we confirm that the SIL-based NFR system can be compatible to BD with a simple relay lens.
机译:我们为基于固体浸没透镜(SIL)的近场记录(NFR)系统和蓝光光盘(BD)设计了兼容的光学元件。基于SIL的NFR系统的工作距离,数值孔径(NA)和覆盖层厚度不同于BD。因此,为了兼容NA为1.46和BD的覆盖层入射型NFR系统,我们使用由两个低NA透镜构成的中继透镜。为了确保可制造性,考虑了诸如偏心,倾斜和SIL厚度公差之类的光学公差。每个光学组件的偏心公差和倾斜公差分别大于1.0μm和0.1°。在波前像差为0.035λ_(rms)的标准下,SIL厚度范围的公差为14μm。我们设计光学布局并模拟BD和基于SIL的NFR系统的每个聚焦误差信号。从实际设计结果来看,我们确认基于SIL的NFR系统可以通过简单的中继透镜与BD兼容。

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  • 来源
    《Japanese journal of applied physics》 |2009年第3issue2期|185-188|共4页
  • 作者单位

    Department of Mechanical Engineering, Yonsei University, 134 Shinchon-dong, Sudaemun-gu, Seoul 120-749, Korea;

    Center for Information Storage Device, Yonsei University, 134 Shinchon-dong, Sudaemun-gu, Seoul 120-749, Korea;

    Center for Information Storage Device, Yonsei University, 134 Shinchon-dong, Sudaemun-gu, Seoul 120-749, Korea;

    Center for Information Storage Device, Yonsei University, 134 Shinchon-dong, Sudaemun-gu, Seoul 120-749, Korea;

    Department of Mechanical Engineering, Yonsei University, 134 Shinchon-dong, Sudaemun-gu, Seoul 120-749, Korea;

    Department of Mechanical Engineering, Yonsei University, 134 Shinchon-dong, Sudaemun-gu, Seoul 120-749, Korea;

    Center for Information Storage Device, Yonsei University, 134 Shinchon-dong, Sudaemun-gu, Seoul 120-749, Korea;

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