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首页> 外文期刊>Japanese journal of applied physics >CMOS temperature sensor using a resistively degenerated common-source amplifier biased by an adjustable proportional-to-absolute-temperature voltage
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CMOS temperature sensor using a resistively degenerated common-source amplifier biased by an adjustable proportional-to-absolute-temperature voltage

机译:CMOS温度传感器,使用电阻性退化的共源放大器,并由可调节的比例至绝对温度电压偏置

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摘要

A high-linearity CMOS temperature sensor with pulse output is presented. The temperature core is a resistively degenerated common-source amplifier which gate is biased by a proportional-to-absolute-temperature (PTAT) voltage generator. The source resistor is made of polysilicon which resistance has a PTAT characteristic. The current flowing through the resistor exhibits a PTAT characteristic with high linearity of 99.99% at least for a temperature range from 0 to 125 ℃. The PTAT voltage generator can be adjusted by a bias voltage V_b and hence the PTAT current can also be adjusted by the V_b. The PTAT current is mirrored to an added current controlled oscillator which output pulse frequencies also exhibit a PTAT characteristic. For the chip using the 0.35 μm process, the plots of measured pulse frequencies against temperature exhibit the sensitivity of 2.30 to 2.24kHz/℃ with linearity of more than 99.99% at the V_b of 1 to 1.2 V.
机译:提出了一种具有脉冲输出的高线性度CMOS温度传感器。温度核心是一个电阻退化的共源放大器,其栅极由比例至绝对温度(PTAT)电压发生器偏置。源极电阻器由具有PTAT特性的多晶硅制成。流经电阻的电流至少在0到125℃的温度范围内具有99.99%的高线性度的PTAT特性。 PTAT电压发生器可以通过偏置电压V_b进行调整,因此PTAT电流也可以通过V_b进行调整。 PTAT电流镜像到附加的电流控制振荡器,该振荡器的输出脉冲频率也具有PTAT特性。对于采用0.35μm工艺的芯片,在1至1.2 V的V_b处,测得的脉冲频率与温度的关系曲线显示出2.30至2.24kHz /℃的灵敏度,线性度超过99.99%。

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  • 来源
    《Japanese journal of applied physics》 |2014年第4s期|04EJ06.1-04EJ06.5|共5页
  • 作者单位

    Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 82444, Taiwan;

    Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 82444, Taiwan;

    Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 82444, Taiwan;

    Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 82444, Taiwan;

    Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 82444, Taiwan;

    National Chip Implementation Center, National Applied Research Laboratories, Hsinchu 300, Taiwan;

    National Chip Implementation Center, National Applied Research Laboratories, Hsinchu 300, Taiwan;

    National Chip Implementation Center, National Applied Research Laboratories, Hsinchu 300, Taiwan;

    National Chip Implementation Center, National Applied Research Laboratories, Hsinchu 300, Taiwan;

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