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All-copper contacting technology for film-vs-film electric connection using cool plasma sintering

机译:全铜接触技术,采用冷等离子体烧结进行薄膜与薄膜的电连接

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摘要

Tiling expansion enables the fabrication of large-area electronics at a much lower equipment cost than manufacturing a large-area device in one piece. Thin connection technology is expected to play a key role there. Contact resistances of the existing film-type flexible connectors are, however, rather high, compared with the conventional connectors or soldering. To realize a lower contact resistance, we inserted copper ink between two mating electrodes on a pair of films and sintered it by cool plasma sintering, a technology recently developed by our group. We achieved a contact resistance of about 20 m ohm, which is sufficiently low and compatible with the most demanding applications. (C) 2017 The Japan Society of Applied Physics
机译:与单个制造大面积设备相比,平铺扩展能够以低得多的设备成本制造大面积电子设备。瘦连接技术有望在那里发挥关键作用。然而,与传统的连接器或焊接相比,现有的薄膜型柔性连接器的接触电阻相当高。为了实现更低的接触电阻,我们将铜墨水插入一对膜上的两个配对电极之间,然后通过冷等离子体烧结进行烧结,这是我们小组最近开发的技术。我们实现了约20 m ohm的接触电阻,该电阻足够低,并且与最苛刻的应用兼容。 (C)2017日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2017年第5s2期|05EB04.1-05EB04.4|共4页
  • 作者

    Shirakawa Naoki;

  • 作者单位

    Natl Inst Adv Ind Sci & Technol, Flexible Elect Res Ctr, Tsukuba, Ibaraki 3058565, Japan;

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  • 正文语种 eng
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