A comprehensive analysis of improving the conforming rate of colour-filter manufacturing processes using Six Sigma

摘要

This research is to apply the Six Sigma define, measure, analyse, improve, and control (DMAIC) approach to reduce the defects of colour filters (CFs) of TFT-LCDs and colour STN-LCDs with respect to a key quality characteristic of gravitation and circumferential colour difference (GCCD), and hence improve their process yield. Since most of the CFs' defects are reported from imperfection of the GCCD, a crucial process called the photo spacer (PS) manufacturing process is first defined, which influences the final result of the GCCD. Secondly, the measurement systems are measured to ensure their accuracy. The determinants resulting in imperfection of GCCD are very complicated, therefore we further analyse the factors that lead to such defects and apply design-of-experiment techniques to acquire the optimal combination of the key factors in the PS process. Lastly, the defects regarding the GCCD in the CFs are proved to be greatly reduced as these key factors are controlled in the optimal setting. The result of this research shows that by applying the Six Sigma DMAIC technique the conforming rate of CFs in the PS manufacturing process can be increased so as to improve the quality of TFT-LCDs and colour STN-LCDs.