Simulation of Microstrip Reflectometer System for Complex Reflection Coefficient Measurements

摘要

This technical paper presents a simulation of three probes reflectometer system for complex reflection coefficient measurement. This involves designing a circuit of Reflectometer using Genesys software. The simulation results and data from published Three-Probe Reflectometer measurement system is being compared to show the accuracy of the simulation results. Using the design circuit, a microstrip circuit will be fabricated and complex reflection coefficients were measured using Vector Network Aaalyzer (VNA). A comparison was made among simulations, VNA and publishes data. From the comparison, it shows a close agreement among them. It shows that Microstrip Reflectometer measure Complex Reflection Coefficient.