Large-signal variability of microwave power amplifiers throughefficient device sensitivity-based physical modeling

摘要

In the present article they present a comprehensive variability analysis of microwavepower amplifiers in various operating classes by means of a recently developednumerically efficient technique for the physics-based variability analysis of devicesoperated in nonlinear conditions. Both a class A and a deep class AB power amplifierare considered, with the active device undergoing variations of main physical parameterssuch as doping, gate work function, and gate length. The results presented showfor the first time that the physics-based variability analysis of nonlinear circuits is feasibleand allows for a direct link between the PA performance uncertainty and theactive device technological parameter variations. Both deterministic and statisticalvariations are taken into account, showing that the approach of Donati Guerrieri et al.(2016) allows for an aggressive reduction in computation time with respect to thevariability analysis by means of conventional approaches, while retaining very goodaccuracy for parameter variations up to 10% of their nominal value. The highest sensitivityof the class A stage is found for the drain efficiency, while the class AB stagehas a more involved behavior, with the highest sensitivity shifting from the drain efficiencyto the output power as the input power increases.