Towards a knowledge-based scheduling system for semiconductor testing

摘要

This paper describes our efforts towards the development of a knowledge-based scheduling system for the scheduling of semiconductor testing operations. Semiconductor testing is the final phase of a four-phase semiconductor manufac- Turing process. The scheduling problem is a static deterministic version of what We call the workstation scheduling problem (WS). WS can be characterized as a Generalized job shop problem with both parallel workstation clusters and batch Processors; it requires sequencing and routeing decisions on discrete (i.e. non- Batch) and batch workstations. The proposed system consists of two distinct Components: a knowledge base developed using a frame-based knowledge repre- Sentation scheme., and a solution strategy based on filtered beam search.