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首页> 外文期刊>International journal of modeling, simulation and scientific computing >Analytical modeling of AlInSb/InSb MOS gate HEMT structure with improved performance
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Analytical modeling of AlInSb/InSb MOS gate HEMT structure with improved performance

机译:具有改进性能的AlInSb / InSb MOS栅极HEMT结构的分析模型

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摘要

The performance of AlInSb/InSb heterostructure with various parameters is considered with T-Cad simulation. As the heterojunctions are having more advantageous properties that is a real support for so many application such as solar cells, semiconductor cells and transistors. Special properties of semiconductors are discussed here with various parameters that are depending up on the performance of accurate device [Pardeshi H., Pati S. K., Raj G., Mohankumar N., Sarkar C. K., J. Semicond. 33(12):124001-1-124001-7, 2012]. The maximum drain current density is achieved with improving the density of two-dimensional electron gas (2DEG) and with high velocity. High electron mobility transistor (HEMT) structure is used with the different combinations of layers which have different bandgaps. Parameters such as electron mobility, bandgap, dielectric constant, etc., are considered differently for each layer [Zhang A., Zhang L., Tang Z., IEEE Trans. Electron Devices 61(3):755-761, 2014]. The high electron mobility electrons are now widely used in so many applications. The proposed work of AlInSb/InSb heterostructure implements the same process which will be a promise for future research works.
机译:通过T-Cad模拟考虑了具有各种参数的AlInSb / InSb异质结构的性能。由于异质结具有更有利的特性,这是对诸如太阳能电池,半导体电池和晶体管之类的许多应用的真正支持。半导体的特殊性能在这里用各种参数来讨论,这些参数取决于精确器件的性能[Pardeshi H.,Pati S.K.,Raj G.,Mohankumar N.,Sarkar C.K.,J.Semicond。 33(12):124001-1-124001-7,2012]。通过提高二维电子气(2DEG)的密度并提高速度可以实现最大漏极电流密度。高电子迁移率晶体管(HEMT)结构用于带隙不同的层的不同组合。对于每个层,诸如电子迁移率,带隙,介电常数等的参数被认为是不同的[Zhang A.,Zhang L.,Tang Z.,IEEE Trans。电子设备61(3):755-761,2014]。现在,高电子迁移率电子被广泛用于许多应用中。 AlInSb / InSb异质结构的拟议工作实现了相同的过程,这将为未来的研究工作带来希望。

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