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Algorithm for Autonomously Calibrating Reference Flat of Interferometer and Residual Influence of Linear Shift with Two-Flat Method

机译:两平面法自动校准干涉仪参考平面和线性位移的残余影响算法

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摘要

A two-flat method for autonomously calibrating the reference flat of an interferometer is proposed with mathematical analysis. The calibration method is comprised of two steps. The first step is multiple rotations of a specimen, and the second is multiple linear shifts of it. hi this study, the usual assumptions regarding the rotation are unnecessary, but the pitching error caused by a linear shift is assumed to be continuous with respect to the linear shift and approximated by zero for any sufficiently small linear shift. The flatness of a reference flat is determined based on the fact that the flatness derived mainly by rotation equals that derived mainly by linear shifts. Based on the above assumptions, the proposed algorithm, which is realized by mainly utilizing basic knowledge of linear algebra in functional space, can be used to determine the rotating tilt errors and linear shift errors, allowing the reference flat to be calibrated accurately, hi this paper, the mathematical algorithm for autonomously calibrating the reference flat is explained in detail.
机译:通过数学分析,提出了一种自动校正干涉仪参考平面的双平面方法。校准方法包括两个步骤。第一步是样品的多次旋转,第二步是样品的多次线性移动。在这项研究中,关于旋转的通常假设是不必要的,但是由线性位移引起的俯仰误差相对于线性位移被假定为连续的,并且对于任何足够小的线性位移都近似为零。参考平面的平坦度是基于以下事实确定的:主要通过旋转获得的平坦度等于主要通过线性移位获得的平坦度。基于上述假设,主要利用功能空间中线性代数的基本知识实现的算法可用于确定旋转倾斜误差和线性位移误差,从而可以对基准平面进行精确校准。在论文中,详细解释了自动校准参考平面的数学算法。

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