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Silicon atom and silicon oxide molecule, within the metallic and semiconducting carbon nanotubes as promising centers candidates for hydrogen adsorption: A DFT theoretical study

机译:DFT理论研究:金属和半导体碳纳米管中的硅原子和氧化硅分子有望成为氢吸附的候选中心

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Hydrogen adsorption on a single Si and SiO2 molecule, doped within C(6,6) and C(10,0) carbon nanotubes (CNTs), is studied using first-principles calculations based on density-functional theory. Two orientations of the H-2 molecule, inside the nanotubes, are compared. Our calculations revealed a rather weak hydrogen binding energy inside both types of pristine CNTs - namely, -0.51 eV/H-2 and -0.38 eV/H-2 for C(6,6) and C(10,0) nanotubes, respectively. When a single Si atom is doped in the interior surface of either type of CNTs, it tends to decouple from the wall and to drift towards the nanotube's axis. A Si atom can bind two hydrogen atoms more strongly (-1.4 eV/H-2 and -1.13 eV/H-2 on Si within metallic and semiconducting CNTs, respectively) than just a pristine CNT would do. A SiO2 molecule binds the hydrogen atoms even stronger, along with formation of water molecule within the metallic CNT. The corresponding binding energy of -1.73 eV/H-2 for the C(6,6) is found to be the highest one among the configurations considered. Based on our resuls, we believe that intrinsically Si and SiO2-doped CNTs can be considered as plausible candidates for enhancing the hydrogen adsorption properties. (C) 2018 Hydrogen Energy Publications LLC. Published by Elsevier Ltd. All rights reserved.
机译:使用基于密度泛函理论的第一性原理研究了氢在单个Si和SiO2分子上的氢吸附,该分子掺杂在C(6,6)和C(10,0)碳纳米管中。比较了纳米管内部H-2分子的两个方向。我们的计算结果表明,两种原始碳纳米管内部的氢键能都非常弱-分别对于C(6,6)和C(10,0)纳米管为-0.51 eV / H-2和-0.38 eV / H-2 。当在两种类型的CNT的内表面中掺杂单个Si原子时,它往往会与壁分离,并向纳米管的轴漂移。 Si原子可以比仅原始CNT更牢固地结合两个氢原子(分别在金属和半导体CNT中的Si上分别为-1.4 eV / H-2和-1.13 eV / H-2)。 SiO2分子更牢固地结合氢原子,同时在金属CNT中形成水分子。发现C(6,6)的相应结合能-1.73 eV / H-2是所考虑的构型中最高的。根据我们的研究结果,我们认为本质上掺有Si和SiO2的CNT可以被视为增强氢吸附性能的可行候选物。 (C)2018氢能出版物有限公司。由Elsevier Ltd.出版。保留所有权利。

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