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Analyzing guard-heating to enable accurate hot-film wall shear stress measurements for turbulent flows

机译:分析防护加热,以对湍流进行准确的热膜壁切应力测量

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摘要

In this paper we examine guard-heated hot-film sensors for the measurement of wall shear stress fluctuations in turbulent flows, using analytical and numerical techniques. The new thermal sensor designs proposed here, seek to eliminate the most severe source of error in conventional single-element hot-film sensors - which is indirect heat transfer to the fluid flow through the solid substrate. Published studies of the single-element hot-film show that a significant portion of the heat generated in the hot-film travels through the substrate before reaching the fluid, which causes spectral and phase errors in the wall shear stress signal and can drastically reduce the spatial resolution of the sensor. In addition, heat conduction parallel to the surface, within the fluid near the sensor edges, can produce significant errors when sensors are made smaller to improve spatial resolution. Here we examine the effectiveness of forcing zero temperature gradient at the edges of the hot-film in eliminating these errors. Air and water flow over such guard-heated sensors are studied numerically to investigate performance and signal strength of the guard-heated sensors. Our results show, particularly for low-conductivity fluids such as air, that edge guard-heating needs to be supplemented by a sub-surface guard-heater. With this two-plane guard-heating, a strong non-linearity in the standard single-element designs can be corrected, and substrate conduction errors contributing to spectral distortion and phase errors can be eliminated.
机译:在本文中,我们使用分析和数值技术研究了保护加热的热膜传感器,该传感器用于测量湍流中壁剪切应力的波动。这里提出的新的热传感器设计旨在消除传统的单元素热膜传感器中最严重的误差源-即间接热量传递到通过固体基质的流体中。对单元素热膜的已发表研究表明,在热膜中产生的大部分热量在到达流体之前先穿过基材,这会引起壁切应力信号中的光谱和相位误差,并可以大大降低传感器的空间分辨率。另外,当传感器变小以提高空间分辨率时,在传感器边缘附近的流体中,平行于表面的导热会产生明显的误差。在这里,我们研究了在热膜边缘施加零温度梯度以消除这些误差的有效性。数值研究了这种保护加热传感器上的空气和水流,以研究保护加热传感器的性能和信号强度。我们的结果表明,特别是对于低电导率的流体(例如空气),边缘保护装置的加热需要补充一个地下保护装置的加热器。通过这种两平面保护加热,可以校正标准单元件设计中的强非线性,并且可以消除造成光谱失真和相位误差的基板导电误差。

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