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首页> 外文期刊>International Journal of Fatigue >Incorporating small fatigue crack growth in probabilistic life prediction: Effect of stress ratio in Ti-6Al-2Sn-4Zr-6Mo
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Incorporating small fatigue crack growth in probabilistic life prediction: Effect of stress ratio in Ti-6Al-2Sn-4Zr-6Mo

机译:在概率寿命预测中纳入小的疲劳裂纹扩展:Ti-6Al-2Sn-4Zr-6Mo中应力比的影响

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摘要

The effect of stress ratio on the statistical aspects of small fatigue crack growth behavior was studied in a duplex microstructure of Ti-6Al-2Sn-4Zr-6Mo (Ti-6-2-4-6) at 260 ℃ with particular emphasis on incorporating small-crack data into probabilistic life prediction and the influence of stress ratio on probabilistic lifetime limits. A Focused Ion Beam (FIB) was used to machine micro-notches in test specimens, which served as crack-initiation sites and enabled the acquisition of multiple small-crack growth data sets from single experiment. Stress ratios of -0.5, 0.05, and 0.5 were employed, and small-crack growth was monitored by the acetate replication method. Qualitatively, change in the stress ratio produced almost negligible influence on the small-crack growth behavior when plotted as crack growth rate (da/dN) vs. applied stress intensity factor range (△K). A probabilistic method was employed to represent the variability in the small-crack growth behavior and the statistical differences with respect to stress ratio where a method of optimization of the small-crack growth model parameters, based on a minimization of the error between the predicted and the measured crack length vs. cycles (a vs. N) data, was used. In spite of qualitative similarity, differences in the statistical parameters of small-crack growth as a function of stress ratio were found to be significant in life prediction. The methods for representation and probabilistic treatment of small-crack data were also shown to be important factors in incorporation of the small-crack regime in probabilistic life prediction.
机译:在260℃的Ti-6Al-2Sn-4Zr-6Mo(Ti-6-2-4-6)双相组织中研究了应力比对小疲劳裂纹扩展行为统计方面的影响。小裂纹数据用于概率寿命预测以及应力比对概率寿命极限的影响。聚焦离子束(FIB)用于在试样中加工微缺口,这些缺口用作裂纹起始点,并能够从单个实验中获取多个小裂纹增长数据集。采用-0.5、0.05和0.5的应力比,并通过乙酸盐复制法监测小裂纹的生长。定性地,当将应力比的变化表示为裂纹增长率(da / dN)与施加应力强度因子范围(△K)时,对小裂纹增长行为的影响几乎可以忽略。采用概率方法来表示小裂纹生长行为的变异性和应力比的统计差异,其中一种基于预测值与误差之间的误差最小化的优化小裂纹生长模型参数的方法使用测得的裂纹长度与循环(a与N)数据。尽管在质量上有相似性,但发现小裂纹增长的统计参数随应力比的变化在寿命预测中仍然很重要。小裂纹数据的表示和概率处理方法也被证明是将小裂纹方案纳入概率寿命预测的重要因素。

著录项

  • 来源
    《International Journal of Fatigue 》 |2013年第6期| 83-95| 共13页
  • 作者单位

    U.S. Air Force Research Laboratory, Materials and Manufacturing Directorate. AFRL/RXCM, Wright-Patterson Air Force Base, OH 45433, United States;

    Universal Technology Corporation, Dayton, OH 45432. United States;

    U.S. Air Force Research Laboratory, Materials and Manufacturing Directorate. AFRL/RXCM, Wright-Patterson Air Force Base, OH 45433, United States;

    U.S. Air Force Research Laboratory, Materials and Manufacturing Directorate. AFRL/RXCM, Wright-Patterson Air Force Base, OH 45433, United States;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    small fatigue crack; stress ratio; Ti-6Al-2Sn-4Zr-6Mo; life prediction;

    机译:疲劳裂纹小;应力比Ti-6Al-2Sn-4Zr-6Mo;寿命预测;

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