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首页> 外文期刊>The International Journal of Advanced Manufacturing Technology >An innovative algorithm for statistic sampling of measured points and simplifying measuring probe orientation for sculpture surfaces
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An innovative algorithm for statistic sampling of measured points and simplifying measuring probe orientation for sculpture surfaces

机译:一种用于对测量点进行统计采样并简化雕塑表面的测量探针方向的创新算法

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摘要

As living standards have improved, the requirements of appearance modeling variables have also increased. Although several CAD systems can design and modeling needed products with complicated geometric, but the questions of measuring methods and workpiece error-detection are also growing. For the contact measuring method, besides measuring collision and probe orientation, the sampling points and their distributed locations are the important factors that influence measuring time as well as precision. In this paper, the sampling statistics technique was used to calculate the minimum number of sampling points, which will tally the contour tolerance requirements of the measured surface. Next, the suitable locations for sampling points will be carried out using the one-half sampling distribution method. Finally, the 2D space picture of measuring characteristic of five-axis CMM (CMM-space) was developed for measuring probe’s orientation in the measuring process. As a result, an algorithm of measuring characteristic matrix of five-axis CMM (CMM-matrix) and the minimum times of the measuring probe’s placement was derived to reduce the measuring time and improve the measuring efficiency.
机译:随着生活水平的提高,外观建模变量的要求也随之提高。尽管有几种CAD系统可以设计和建模所需的具有复杂几何形状的产品,但是测量方法和工件错误检测的问题也在不断增长。对于接触式测量方法,除了测量碰撞和探头方向外,采样点及其分布位置是影响测量时间和精度的重要因素。在本文中,采样统计技术用于计算最小采样点数,这将符合被测表面的轮廓公差要求。接下来,将使用二分之一的采样分布方法来执行采样点的合适位置。最后,开发了五轴坐标测量机测量特性的二维空间图片(CMM-space),用于在测量过程中测量探头的方向。结果,得出了一种测量五轴坐标测量机特征矩阵(CMM矩阵)和最小化测量探头放置时间的算法,以减少测量时间并提高测量效率。

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