首页> 外文期刊>Instrumentation and Measurement, IEEE Transactions on >Measuring Dynamic Nonlinearity of Digitizers Affected by Time Base Distortion
【24h】

Measuring Dynamic Nonlinearity of Digitizers Affected by Time Base Distortion

机译:测量受时基失真影响的数字化仪的动态非线性

获取原文
           

摘要

Dynamic nonlinearity is a well-known major source of signal corruption in digital scopes and A/D conversion channels in general, particularly when dealing with fast signals and high sampling rates. This paper shows that the dynamic nonlinearity cannot be correctly measured without taking into account the systematic errors affecting the sampling instants (time base distortion) and presents two methods (nonparametric and parametric) to obtain accurate measurements in the presence of such errors. Both simulations and experimental results are provided to illustrate the problems arising with traditional methodologies and the accuracy of the proposed one.
机译:通常,动态非线性是数字示波器和A / D转换通道中信号损坏的主要主要来源,尤其是在处理快速信号和高采样率时。本文表明,如果不考虑影响采样时刻的系统误差(时基失真),就无法正确测量动态非线性,并提出了两种方法(非参数和参数)来在存在此类误差的情况下获得准确的测量结果。提供的仿真和实验结果均说明了传统方法产生的问题以及所提出方法的准确性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号