Design for automated testing of analog data channels in a PCM switching system

摘要

Semi-automatic suboptimal tests of analog data channels in a time-multiplexed pulse-code modulation (PCM) digital switching system are presented. The intent of the approach used was to provide a computer-controlled go, no-go testing capability for the analog I/O channels of the switch. Interplay between hardware design constraints and desired testability features are discussed. Results of maintainability demonstration tests were satisfying. Methods for improving the capabilities of this approach (i.e., provision of optimal characteristics) are readily available.