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首页> 外文期刊>IEEE Transactions on Instrumentation and Measurement >Comparison of quantized Hall resistances R/sub H/(2) and R/sub H/(4) of a GaAs/AlGaAs heterostructure device
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Comparison of quantized Hall resistances R/sub H/(2) and R/sub H/(4) of a GaAs/AlGaAs heterostructure device

机译:GaAs / AlGaAs异质结构器件的量化霍尔电阻R / sub H /(2)和R / sub H /(4)的比较

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摘要

Quantized Hall resistances R/sub H/(4) and R/sub H/(2) of a GaAs/AlGaAs heterostructure were compared with reference resistors whose values are close to h/4e/sup 2/ or h/2e/sup 2/. The values of the reference resistors were compared with a 100 ohm standard resistor via a cryogenic current comparator (CCC) resistance bridge. Results showed that (4/spl times/R/sub H/(4)-2/spl times/R/sub H/(2))/2/spl times/R/sub H/(2)=(0.037/spl plusmn/0.019)/spl times/10/sup -6/.
机译:将GaAs / AlGaAs异质结构的量化霍尔电阻R / sub H /(4)和R / sub H /(2)与参考电阻进行比较,该参考电阻的值接近h / 4e / sup 2 /或h / 2e / sup 2 /。通过低温电流比较器(CCC)电阻桥将参考电阻器的值与100 ohm标准电阻器进行比较。结果显示(4 / spl次/ R / sub H /(4)-2 / spl次/ R / sub H /(2))/ 2 / spl次/ R / sub H /(2)=(0.037 / spl plusmn / 0.019)/ spl times / 10 / sup -6 /。

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