The linear error-mechanism modeling technique is an effective tool for testing analog and mixed-signal devices which minimizes the number of measurements required to characterize the static transfer function of a circuit by determining a small number of parameters of a linear error model and then predicting the entire response error. This work focuses on optimizing the linear error-mechanism model algorithm (LEMMA), introducing novel refinements which are shown to improve its performance significantly. We outline the implementation of the algorithm in a tutorial manner, paying due consideration to the underlying theory where required.
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